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author:

Yang, Kaiyu (Yang, Kaiyu.) [1] | Zheng, Jinping (Zheng, Jinping.) [2] | Mao, Jinliang (Mao, Jinliang.) [3] | Zhao, Haobing (Zhao, Haobing.) [4] | Ju, Songman (Ju, Songman.) [5] | Zhang, QingKai (Zhang, QingKai.) [6] | Lin, Zhihan (Lin, Zhihan.) [7] | Yu, Yongshen (Yu, Yongshen.) [8] | Li, Fushan (Li, Fushan.) [9]

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EI

Abstract:

Perovskite quantum dot light-emitting diodes (QLEDs) with high color purity and wide color gamut have good application prospects in the next generation of display technology. However, colloidal perovskite quantum dots (PQDs) may introduce a large number of defects during the film-forming process, which is not conducive to the luminous efficiency of the device. Meanwhile, the disordered film formation of PQDs will form interfacial defects and reduce the device performance. Here, we report an interface-induced crystallinity enhancement (IICE) strategy to increase the crystallinity of PQDs at the hole transport layer (HTL)/PQD interface. As a result, both the Br- vacancies in the PQD film and the interfacial defects were well passivated and the leakage current was also suppressed. We achieved QLEDs with a maximum external quantum efficiency (EQE) of 16.45% and current efficiency (CE) of 61.77 cd/A, showing improved performance to more than twice that of the control devices. The IICE strategy paves a new way to enhance the crystallinity of PQD films, so as to improve the performance of QLEDs for application in the future display field. © 2023 American Chemical Society.

Keyword:

Alkali metals Crystallinity Defects Nanocrystals Organic light emitting diodes (OLED) Perovskite Quantum efficiency Semiconductor quantum dots

Community:

  • [ 1 ] [Yang, Kaiyu]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 2 ] [Yang, Kaiyu]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350108, China
  • [ 3 ] [Zheng, Jinping]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 4 ] [Mao, Jinliang]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 5 ] [Zhao, Haobing]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 6 ] [Ju, Songman]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 7 ] [Zhang, QingKai]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 8 ] [Lin, Zhihan]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 9 ] [Yu, Yongshen]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350108, China
  • [ 10 ] [Li, Fushan]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 11 ] [Li, Fushan]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350108, China

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Source :

ACS Applied Materials and Interfaces

ISSN: 1944-8244

Year: 2023

Issue: 33

Volume: 15

Page: 40062-40069

8 . 5

JCR@2023

8 . 5 0 0

JCR@2023

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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