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author:

Xu, Hai-Long (Xu, Hai-Long.) [1] | Chen, Kong-Jie (Chen, Kong-Jie.) [2] | Chen, Pei-Qi (Chen, Pei-Qi.) [3] | Zhou, Xiong-Tu (Zhou, Xiong-Tu.) [4] (Scholars:周雄图) | Guo, Tai-Liang (Guo, Tai-Liang.) [5] (Scholars:郭太良) | Wu, Chao-Xing (Wu, Chao-Xing.) [6] (Scholars:吴朝兴) | Zhang, Yong-Ai (Zhang, Yong-Ai.) [7] (Scholars:张永爱)

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EI Scopus PKU CSCD

Abstract:

In this paper non-electrical contactNEC GaN-based Micro-LED devices were prepared by metal organic chemical vapor depositionMOCVD and atomic layer depositionALD because a series of problems would emerge including mass transfer bonding and high-quality contact between chips and driving electrodes as the LED chip size is further decreased. We investigated the photoelectric characteristics of NEC Micro-LED devices such as the current-voltageI-V luminance-frequencyL-F luminescence delay and impedance-frequencyI-F characteristics and the working mechanism of the device is also analyzed. These experimental results indicate that the current of the NEC Micro-LED device increases with the increase of the frequency and I-V curves have linear relationships under the role of the alternating-current drive. At the driving signal of 20Vpp the luminances of the NEC Micro-LED device first increase and then fall with the gradual increases of the frequencies. When the frequency is 25 MHz the luminance of NEC Micro-LED device reaches to be the maximum. Moreover the luminescence peak lags behind the current peak indicating that the luminescence of the device is delayed. Besides the equivalent impedance of the NEC Micro-LED device decreases and finally tends to be stable with the increases of the frequencies and the device shows the negative capacitance phenomenon around the frequency of 53 MHz. © 2022 Chines Academy of Sciences. All rights reserved.

Keyword:

Atomic layer deposition Capacitance Chemical bonds Electric impedance measurement Gallium nitride III-V semiconductors Luminance Luminescence Mass transfer Metallorganic chemical vapor deposition Organic chemicals Organometallics Photoelectricity

Community:

  • [ 1 ] [Xu, Hai-Long]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 2 ] [Chen, Kong-Jie]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 3 ] [Chen, Pei-Qi]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 4 ] [Zhou, Xiong-Tu]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 5 ] [Zhou, Xiong-Tu]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350108, China
  • [ 6 ] [Guo, Tai-Liang]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 7 ] [Guo, Tai-Liang]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350108, China
  • [ 8 ] [Wu, Chao-Xing]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 9 ] [Wu, Chao-Xing]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350108, China
  • [ 10 ] [Zhang, Yong-Ai]College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 11 ] [Zhang, Yong-Ai]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350108, China

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Source :

Chinese Journal of Luminescence

ISSN: 1000-7032

CN: 22-1116/O4

Year: 2022

Issue: 10

Volume: 43

Page: 1592-1600

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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