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author:

Luo, Rongxiang (Luo, Rongxiang.) [1] (Scholars:罗荣祥) | Guo, Juncheng (Guo, Juncheng.) [2] (Scholars:郭君诚) | Zhang, Jun (Zhang, Jun.) [3] (Scholars:张峻) | Yang, Hanxin (Yang, Hanxin.) [4] (Scholars:杨涵新)

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Abstract:

It has recently been shown that in one-dimensional hard-point gases, there is a mechanism that induces negative differential thermal resistance (NDTR) between heat baths. We examine this mechanism in more general higher-dimensional fluids described by multiparticle collision dynamics. We consider fluids in a finite cuboid region of three-dimensional space with each end in contact with a heat bath. Based on analytical results and numerical models, we find that the mechanism underlying NDTR also works for high-dimensional fluidic systems with weak interactions and is very robust to mixed fluids. Our results significantly advance knowledge of NDTR induced by heat baths and illuminate different directions to explore in fabricating fluid thermal transistors in micro- and nanosystems. © 2022 authors. Published by the American Physical Society. Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.

Keyword:

Heat resistance

Community:

  • [ 1 ] [Luo, Rongxiang]Department of Physics, Fuzhou University, Fujian, Fuzhou; 350108, China
  • [ 2 ] [Luo, Rongxiang]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fujian, Fuzhou; 350108, China
  • [ 3 ] [Guo, Juncheng]Department of Physics, Fuzhou University, Fujian, Fuzhou; 350108, China
  • [ 4 ] [Zhang, Jun]Department of Physics, Fuzhou University, Fujian, Fuzhou; 350108, China
  • [ 5 ] [Yang, Hanxin]Department of Physics, Fuzhou University, Fujian, Fuzhou; 350108, China

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Source :

Physical Review Research

ISSN: 2643-1564

Year: 2022

Issue: 4

Volume: 4

4 . 2

JCR@2022

3 . 5 0 0

JCR@2023

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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