• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Wu, Chaoxing (Wu, Chaoxing.) [1] (Scholars:吴朝兴) | Li, Fushan (Li, Fushan.) [2] (Scholars:李福山) | Zhang, Yongai (Zhang, Yongai.) [3] (Scholars:张永爱) | Guo, Tailiang (Guo, Tailiang.) [4] (Scholars:郭太良) | Chen, Ting (Chen, Ting.) [5]

Indexed by:

EI Scopus SCIE

Abstract:

The functionalization of graphene oxide (GO) sheets with polyimide (PI) enables the layer-by-layer fabrication of a GO-PI hybrid resistive-switch device and leads to high reproducibility of the memory effect. The current-voltage curves for the as-fabricated device exhibit multilevel resistive-switch properties under various reset voltages. The capacitance-voltage characteristics for a capacitor based on GO-PI nanocomposite indicate that the electrical switching may originate from the charge trapping in GO sheets. The high device-to-device uniformity and unique memory properties of the device make it an attractive candidate for applications in next-generation high-density nonvolatile flash memories. (C) 2011 American Institute of Physics. [doi:10.1063/1.3619815]

Keyword:

Community:

  • [ 1 ] [Wu, Chaoxing]Fuzhou Univ, Inst Optoelect Display, Fuzhou 350002, Peoples R China
  • [ 2 ] [Li, Fushan]Fuzhou Univ, Inst Optoelect Display, Fuzhou 350002, Peoples R China
  • [ 3 ] [Zhang, Yongai]Fuzhou Univ, Inst Optoelect Display, Fuzhou 350002, Peoples R China
  • [ 4 ] [Guo, Tailiang]Fuzhou Univ, Inst Optoelect Display, Fuzhou 350002, Peoples R China
  • [ 5 ] [Chen, Ting]Natl Univ Singapore, Dept Mat Sci & Engn, Singapore 117574, Singapore

Reprint 's Address:

  • 李福山

    [Li, Fushan]Fuzhou Univ, Inst Optoelect Display, Fuzhou 350002, Peoples R China

Show more details

Related Keywords:

Related Article:

Source :

APPLIED PHYSICS LETTERS

ISSN: 0003-6951

Year: 2011

Issue: 4

Volume: 99

3 . 8 4 4

JCR@2011

3 . 5 0 0

JCR@2023

ESI Discipline: PHYSICS;

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 87

SCOPUS Cited Count: 96

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

Online/Total:167/10063154
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1