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author:

Lin, M. (Lin, M..) [1] | Peng, Y. (Peng, Y..) [2] | Zhou, X. (Zhou, X..) [3] (Scholars:周雄图) | Lin, T. (Lin, T..) [4] | Zhang, Y. (Zhang, Y..) [5] (Scholars:张永爱) | Hu, J. (Hu, J..) [6] | Guo, T. (Guo, T..) [7] (Scholars:郭太良)

Indexed by:

EI Scopus SCIE

Abstract:

The morphology, microstructure and field emission (FE) properties of tetrapod shaped Sn doped ZnO (T-SZO) nanostructures grown for different times were investigated. It is found that the morphology, particularly the aspect ratio of the T-SZO, can be controlled by adjusting the growth time and that the aspect ratio affects its FE properties. The aspect ratio increases first with the growth time, and after 90 s, a new series of T-SZO with smaller size and lower aspect ratio appear, leading to the deterioration of the FE properties. The sample grown for 90 s exhibits the highest aspect ratio of 16:5 and the lowest turn on field of 1.82 V mu m(-1).

Keyword:

Field emission Morphology Thermal evaporation ZnO tetrapods

Community:

  • [ 1 ] [Lin, M.]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Fujian, Peoples R China
  • [ 2 ] [Peng, Y.]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Fujian, Peoples R China
  • [ 3 ] [Zhou, X.]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Fujian, Peoples R China
  • [ 4 ] [Lin, T.]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Fujian, Peoples R China
  • [ 5 ] [Zhang, Y.]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Fujian, Peoples R China
  • [ 6 ] [Guo, T.]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Fujian, Peoples R China
  • [ 7 ] [Hu, J.]Taiyuan Univ Technol, MicroNano Syst Res Ctr, Coll Informat Engn, Taiyuan 030024, Shanxi, Peoples R China

Reprint 's Address:

  • 周雄图

    [Zhou, X.]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Fujian, Peoples R China

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Source :

MATERIALS TECHNOLOGY

ISSN: 1066-7857

Year: 2015

Issue: 6

Volume: 30

Page: 338-343

1 . 4 4 2

JCR@2015

2 . 9 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:335

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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