This　paper　describes　the　analysis　and　design　of　a　discrete-time　(DT)　fully　dynamic　3-0　multi-stage　noise-shaping　(MASH)　delta-sigma　(Delta　Sigma)　analog-to-digital　converter　(ADC).　Through　system-level　analysis,　error　source　analysis,　nonlinearity　analysis　and　modeling　of　the　integrators,　and　detailed　considerations　for　circuit　implementation,　the　trade-offs　between　design　parameters　in　the　3-0　MASH　Delta　Sigma　ADC　were　evaluated.　The　proposed　ADC　is　fabricated　and　measured　in　a　180　nm　CMOS　process,　achieving　a　DR,　peak　SNDR,　and　SFDR　of　100.2　dB,　98.5　dB,　and　116.7　dB,　respectively,　within　a　2.56　kHz　bandwidth,　consuming　only　20.1　mu　W.　As　a　result,　the　Schreier　figure-of-merit　(FoM)　for　SNDR　and　DR　are　179.6　dB　and　181.3　dB,　respectively.　The　measurement　results　of　the　prototype　3-0　MASH　Delta　Sigma　ADC　closely　matched　the　theoretical　predictions.　This　consistency　between　the　measurements　and　the　theoretical　analysis　confirms　the　reliability　of　the　design　approach　in　achieving　the　expected　performance.