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author:

Qian, Fengsong (Qian, Fengsong.) [1] | Deng, Jun (Deng, Jun.) [2] | Dong, Yibo (Dong, Yibo.) [3] | Xu, Chen (Xu, Chen.) [4] | Hu, Liangchen (Hu, Liangchen.) [5] | Fu, Guosheng (Fu, Guosheng.) [6] | Chang, Pengying (Chang, Pengying.) [7] | Xie, Yiyang (Xie, Yiyang.) [8] | Sun, Jie (Sun, Jie.) [9]

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EI

Abstract:

Direct chemical vapor deposition of graphene on semiconductors and insulators provides high feasibility for integration of graphene devices and semiconductor electronics. However, the current methods typically rely on high temperatures (>1000 °C), which can damage the substrates. Here, a growth method for high-quality large-area graphene at 300 °C is introduced. A multizone furnace with gradient temperature control was designed according to a computational fluid dynamics model. The crucial roles of the chamber pressure in the film continuity and hydrogen composition in the graphene defect density at low temperature were revealed. As a result, a uniform graphene film with the Raman ratio ID/IG= 0.08 was obtained. Furthermore, a technique of laminating single-crystal Cu foil as a sacrificial layer on the substrate was proposed to realize transfer-free growth, and a wafer-scale graphene transistor array was demonstrated with good performance consistency, which paves the way for mass fabrication of graphene devices. © 2022 American Chemical Society. All rights reserved.

Keyword:

Chemical vapor deposition Computational fluid dynamics Fabrication Graphene Graphene transistors Metal cladding Silicon wafers Single crystals Substrates Temperature

Community:

  • [ 1 ] [Qian, Fengsong]Key Laboratory of Optoelectronics Technology, Beijing University of Technology, Ministry of Education, Beijing; 100124, China
  • [ 2 ] [Deng, Jun]Key Laboratory of Optoelectronics Technology, Beijing University of Technology, Ministry of Education, Beijing; 100124, China
  • [ 3 ] [Dong, Yibo]Institute of Photonic Chips, University of Shanghai for Science and Technology, Shanghai; 200093, China
  • [ 4 ] [Xu, Chen]Key Laboratory of Optoelectronics Technology, Beijing University of Technology, Ministry of Education, Beijing; 100124, China
  • [ 5 ] [Hu, Liangchen]Key Laboratory of Optoelectronics Technology, Beijing University of Technology, Ministry of Education, Beijing; 100124, China
  • [ 6 ] [Fu, Guosheng]Fert Beijing Institute, School of Microelectronics, Beihang University, Beijing; 100191, China
  • [ 7 ] [Chang, Pengying]Key Laboratory of Optoelectronics Technology, Beijing University of Technology, Ministry of Education, Beijing; 100124, China
  • [ 8 ] [Xie, Yiyang]Key Laboratory of Optoelectronics Technology, Beijing University of Technology, Ministry of Education, Beijing; 100124, China
  • [ 9 ] [Sun, Jie]National and Local United Engineering Laboratory of Flat Panel Display Technology, Fuzhou University, Fuzhou; 350100, China
  • [ 10 ] [Sun, Jie]Mindu Innovation Laboratory, Fuzhou; 350100, China

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Source :

ACS Applied Materials and Interfaces

ISSN: 1944-8244

Year: 2022

Issue: 47

Volume: 14

Page: 53174-53182

9 . 5

JCR@2022

8 . 5 0 0

JCR@2023

ESI HC Threshold:91

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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