SnS　films　with　thicknesses　of　20-65　nm　have　been　deposited　on　glass　substrates　by　thermal　evaporation.　The　physical　properties　of　the　films　were　investigated　using　X-ray　diffraction　(XRD),　scanning　electron　microscopy,　X-ray　photoelectron　spectroscopy　(XPS),　Raman　spectroscopy,　and　ultraviolet-visible-　near　infrared　spectroscopy　at　room　temperature.　The　results　from　XRD,　XPS　and　Raman　spectroscopy　analyses　indicate　that　the　deposited　films　mainly　exhibit　SnS　phase,　but　they　may　contain　a　tiny　amount　of　Sn2S3.　The　deposited　SnS　films　are　pinhole　free,　smooth　and　strongly　adherent　to　the　surfaces　of　the　substrates.　The　color　of　the　SnS　films　changes　from　pale　yellow　to　brown　with　the　increase　of　the　film　thickness　from　20　nm　to　65　nm.　The　very　smooth　surfaces　of　the　thin　films　result　in　their　high　reflectance.　The　direct　bandgap　of　the　films　is　between　2.15　eV　and　2.28　eV　which　is　much　larger　than　1.3　eV　of　bulk　SnS,　this　is　deserving　to　be　investigated　further.　©　2011　Elsevier　B.V.　All　rights　reserved.