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Abstract：
Based on the model of memeristor fabricated at HP laboratory, a new multiplexed flip-flop is proposed which can support power-off mode for scan testing. Testing data can be stored in memristor during the power-off time. The analyzes are verified with SPICE simulation, signal waveforms show that the presented memristive multiplexed flip-flop meet the requirements for low-power scan testing. © 2016 IEEE.
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Year： 2016
Language： English
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