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author:

Ran, GZ (Ran, GZ.) [1] | Chen, Y (Chen, Y.) [2] | Chen, KM (Chen, KM.) [3] | Zhang, XL (Zhang, XL.) [4] | Liu, HG (Liu, HG.) [5]

Indexed by:

EI Scopus SCIE PKU CSCD

Abstract:

A New method for analyzing the isothermal capacitance transience is suggested, which is referred to as the isothermal capacitance transience - time spectroscopy ( ICTTS) -. The method can be used to observe highly deep levels in semiconductors with wide band gaps near the room temperature. The deep levels of solid C-70/p-GaAs heterojunctions are investigated by this method. It is found that there are two hole traps, H-1 and H-2 with level of E-v + 0.856 eV and E-v + 1.037 eV in solid C-70, respectively.

Keyword:

C-70 deep levels isothermal capacitance transience

Community:

  • [ 1 ] Peking Univ, Coll Phys, Beijing 100871, Peoples R China
  • [ 2 ] Fuzhou Univ, Dept Electron Sci & Appl Phys, Fuzhou 350002, Peoples R China
  • [ 3 ] Res Inst Nonferrous Met, Beijing 100088, Peoples R China

Reprint 's Address:

  • [Ran, GZ]Peking Univ, Coll Phys, Beijing 100871, Peoples R China

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Source :

ACTA PHYSICA SINICA

ISSN: 1000-3290

CN: 11-1958/O4

Year: 2004

Issue: 10

Volume: 53

Page: 3498-3503

1 . 2 5

JCR@2004

0 . 8 0 0

JCR@2023

ESI Discipline: PHYSICS;

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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