Scan　testing　is　the　key　technology　in　the　design　for　test　of　integrated　circuit.　For　existing　scan　testing　methods,　the　scan-in　for　test　stimuli　requires　many　clock　cycles,　which　is　one　of　the　main　restrictions　of　scan　testing.　To　shorten　the　scan　testing　time　of　an　integrated　circuit,　a　novel　test　stimulus　scan-in　method　was　proposed　in　this　study.　First,　scan　chains,　test　stimuli,　and　test　responses　were　grouped　according　to　a　fixed　bit-width.　Second,　logic　XOR　calculation　results　of　test　response　and　test　stimuli　were　coded　according　to　the　bit-width　of　each　group.　The　corresponding　decoding　and　control　circuits　were　added　in　the　netlist　of　the　circuit,　which　achieved　fast　input　of　test　stimuli.　Finally,　an　experiment　using　ISCAS＇89　and　IWLS　2005　benchmark　circuits　was　performed.　Experimental　results　were　compared　with　those　that　used　a　serial　input　method　of　test　stimuli.　Results　demonstrate　that　the　proposed　method　can　save　approximately　37.5%　and　43.7%　of　test　time　in　average　when　the　width　of　each　group　are　4　bits　and　8　bits,　respectively.　The　proposed　method　can　decrease　the　clock　cycles　of　scan　testing　significantly　and　shorten　the　scan　testing　time　of　the　integrated　circuit.　Conclusions　obtained　in　this　study　provide　significant　references　for　improving　the　scan　testing　method　of　digital　integrated　circuit.