Test　vector　coding　and　data　transmission　are　the　key　technologies　in　the　design-for-test　of　digital　integrated　circuits　(IC).　Existing　parallel　input　methods　of　test　stimuli　can　reduce　test　application　times;　however,　they　need　to　occupy　multiple　input　ports.　Thus,　a　novel　method　of　test　stimuli　coding　and　data　transmission　was　proposed　to　reduce　the　test　application　time　of　the　test　vectors　and　reduce　the　number　of　input　ports　required　for　the　parallel　input　of　test　stimuli.　This　method　was　based　on　the　segmentation　of　test　stimuli.　First,　the　test　stimuli　were　evenly　segmented　into　eight-bit　wide.　Second,　the　eight-bit　data　of　each　segment　were　encoded　to　the　five-bit　data　according　to　the　compatibility　between　the　test　data　of　each　segment.　The　eight-bit　test　stimuli　input　can　be　completed　in　one　or　two　clock　cycles　of　automatic　test　equipment　(ATE)　by　using　the　five　input　ports　of　the　chip.　The　corresponding　decoding　circuit　was　added　inside　the　netlist　of　the　circuit　to　realize　the　rapid　input　of　the　test　stimuli.　Lastly,　the　ISCAS＇89　benchmark　circuit　was　used　to　conduct　experiments,　results　of　this　coding　method　were　then　compared　with　those　of　the　serial　input　method.　Results　show　that　the　encoding　method　proposed　in　this　study　can　save　an　average　of　37%　of　the　parallel　input　data　width　and　81.7%　of　the　test　stimuli　input　time.　The　proposed　method　in　this　study　can　also　reduce　the　test　application　time　and　the　cost　of　the　IC　test.　The　findings　of　this　study　can　provide　guidance　for　improving　the　scan　testing　method　of　digital　IC.