• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Li, Zhenhui (Li, Zhenhui.) [1] | Xu, Ke (Xu, Ke.) [2] | Wei, Fanan (Wei, Fanan.) [3] (Scholars:魏发南)

Indexed by:

EI Scopus SCIE

Abstract:

Scanning ion conductance microscopy has a widespread application in imaging non-conductive substrates, especially biological samples due to its high-resolution and non-contact imaging. In this work, state-of-the-art achievements on exploring samples' surface properties including surface morphology, sample conductivity and dynamics using scanning ion conductance microscopy are firstly introduced, which confirm that scanning ion conductance microscopy is such a mature technology that realises non-invasive and high-resolution imaging. Then, combinations with scanning electrochemical microscopy and atomic force microscopy are demonstrated, which realise the multifunction of scanning ion conductance microscopy. Furthermore, improvements that can help enhance the imaging rate are presented. Finally, the future direction of scanning ion conductance microscopy is discussed.

Keyword:

atomic force microscopy cellular biophysics high-resolution imaging ion microscopy nonconductive substrates noncontact imaging noninvasive imaging sample conductivity scanning electrochemical microscopy scanning ion conductance microscopy surface conductivity surface morphology surface properties

Community:

  • [ 1 ] [Li, Zhenhui]Shenyang Jianzhu Univ, Sch Informat & Control Engn, Shenyang 110000, Liaoning, Peoples R China
  • [ 2 ] [Xu, Ke]Shenyang Jianzhu Univ, Sch Informat & Control Engn, Shenyang 110000, Liaoning, Peoples R China
  • [ 3 ] [Wei, Fanan]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350000, Fujian, Peoples R China

Reprint 's Address:

  • [Xu, Ke]Shenyang Jianzhu Univ, Sch Informat & Control Engn, Shenyang 110000, Liaoning, Peoples R China

Show more details

Related Keywords:

Source :

MICRO & NANO LETTERS

ISSN: 1750-0443

Year: 2019

Issue: 7

Volume: 14

Page: 744-748

0 . 9 7 5

JCR@2019

1 . 5 0 0

JCR@2023

ESI Discipline: PHYSICS;

ESI HC Threshold:138

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 2

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

Online/Total:61/10109887
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1