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author:

Cheng, Yichong (Cheng, Yichong.) [1] | Liao, Yanping (Liao, Yanping.) [2] | Li, Jie (Li, Jie.) [3] | Guo, Zhan-Sheng (Guo, Zhan-Sheng.) [4]

Indexed by:

CPCI-S EI Scopus

Abstract:

Microstructures and mechanical properties of zinc oxide (ZnO) thin films deposited onto glass substrates by rf magnetron sputtering were studied. Surface morphologies and crystalline structural characteristics were examined using atomic force microscopy (AFM) and X-ray diffraction (XRD), respectively. Mechanical properties were measured by nanoindentation. The crystalline structures of ZnO thin films were well ordered with high c-axis (002) orientations. The surface morphologies of ZnO thin films were smooth and grains grew and distributed uniformly. A single pop-in in the load-displacement curve was clearly observed at a specific depth (7-10nm) of the thin film. The hardness and Young's modulus of ZnO thin films were ranged from 8.2 to 10.4GPa and 105 to 120GPa, respectively.

Keyword:

atomic force microscopy hardness nanoindentation pop-in X-ray diffraction Young's modulus ZnO thin film

Community:

  • [ 1 ] [Cheng, Yichong]Shanghai Univ, Shanghai Inst Appl Math & Mech, Shanghai 200072, Peoples R China
  • [ 2 ] [Guo, Zhan-Sheng]Shanghai Univ, Shanghai Inst Appl Math & Mech, Shanghai 200072, Peoples R China
  • [ 3 ] [Liao, Yanping]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Peoples R China
  • [ 4 ] [Li, Jie]Shanghai Univ, Instrumental Analy & Res Ctr, Shanghai 200444, Peoples R China

Reprint 's Address:

  • [Cheng, Yichong]Shanghai Univ, Shanghai Inst Appl Math & Mech, Shanghai 200072, Peoples R China

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Source :

SECOND INTERNATIONAL CONFERENCE ON SMART MATERIALS AND NANOTECHNOLOGY IN ENGINEERING

ISSN: 0277-786X

Year: 2009

Volume: 7493

Language: English

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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