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author:

Li, Zhenhui (Li, Zhenhui.) [1] | Xu, Ke (Xu, Ke.) [2] | Wei, Fanan (Wei, Fanan.) [3]

Indexed by:

EI

Abstract:

Scanning ion conductance microscopy has a widespread application in imaging non-conductive substrates, especially biological samples due to its high-resolution and non-contact imaging. In this work, state-of-the-art achievements on exploring samples’ surface properties including surface morphology, sample conductivity and dynamics using scanning ion conductance microscopy are firstly introduced, which confirm that scanning ion conductance microscopy is such a mature technology that realises non-invasive and high-resolution imaging. Then, combinations with scanning electrochemical microscopy and atomic force microscopy are demonstrated, which realise the multifunction of scanning ion conductance microscopy. Furthermore, improvements that can help enhance the imaging rate are presented. Finally, the future direction of scanning ion conductance microscopy is discussed. © The Institution of Engineering and Technology 2019.

Keyword:

Atomic force microscopy Ions Morphology Scanning Scanning electron microscopy Surface morphology Surface properties

Community:

  • [ 1 ] [Li, Zhenhui]School of Information and Control Engineering, Shenyang Jianzhu University, Shenyang; 110000, China
  • [ 2 ] [Xu, Ke]School of Information and Control Engineering, Shenyang Jianzhu University, Shenyang; 110000, China
  • [ 3 ] [Wei, Fanan]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350000, China

Reprint 's Address:

  • [xu, ke]school of information and control engineering, shenyang jianzhu university, shenyang; 110000, china

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Source :

Micro and Nano Letters

Year: 2019

Issue: 7

Volume: 14

Page: 744-748

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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