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author:

Pan, Kui (Pan, Kui.) [1] | Zhang, Kaixin (Zhang, Kaixin.) [2] | Deng, Liying (Deng, Liying.) [3] | Lin, Chang (Lin, Chang.) [4] | Li, Yang (Li, Yang.) [5] | Liu, Hengshan (Liu, Hengshan.) [6] | Zhang, Fan (Zhang, Fan.) [7] | Nie, Junyang (Nie, Junyang.) [8] | Sun, Jie (Sun, Jie.) [9] | Su, Anjun (Su, Anjun.) [10] | Chen, Nianrui (Chen, Nianrui.) [11] | Zhou, Jun (Zhou, Jun.) [12] | Yan, Qun (Yan, Qun.) [13] | Guo, Tailiang (Guo, Tailiang.) [14]

Indexed by:

EI

Abstract:

Optoelectronic devices, such as lightemitting diodes (LEDs), based on GaN-based semiconductor compounds are widely used for their advantages of long life, high reliability, and low energy consumption. The persistent challenge is integrating LED with transistors to achieve smaller size, lighter weight, higher speed, and more reliable optoelectronic integrated circuits. Here, we report monolithically and vertically integrated LED-on-FET devices fabricated on a novel GaN epitaxial structure. The designed device structure and fabrication process are simple. It also eliminates the extra area occupied by the transistor, and the shared n-GaN layer between the LED and FET reduces interconnect resistance and improves reliability. The measured threshold voltage (VTh) of the LED-on-FET device is extrapolated as 3.9 V at the voltage (VDD) of 5 V, and VTh decreases with the increase of VDD. More importantly, the gate voltage (VGS) shows good performance in modulated electroluminescence (EL) intensity and switching capability of the LED. The integrated LED efficiently emits light modulation with a wavelength of 440 nm at VDD = 9 V and VGS = 4-9 V (step = 1 V), which are necessary for devices in applications, such as displays and smart lighting. This epitaxy structure and integration scheme is promising in achieving large-scale optoelectronic integrated circuits, such as the next-generation micro-LED and nano-LED with super compact integrated drivers. © 2023 Institute of Electrical and Electronics Engineers Inc.. All rights reserved.

Keyword:

Computer circuits Electroluminescence Energy utilization Epitaxial growth Gallium nitride Gates (transistor) III-V semiconductors Indium compounds Light emitting diodes Reliability Substrates Threshold voltage Tin oxides Wide band gap semiconductors

Community:

  • [ 1 ] [Pan, Kui]the National and Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350100, China
  • [ 2 ] [Pan, Kui]the Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 3 ] [Zhang, Kaixin]the National and Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350100, China
  • [ 4 ] [Zhang, Kaixin]the Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 5 ] [Deng, Liying]the National and Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350100, China
  • [ 6 ] [Deng, Liying]the Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 7 ] [Lin, Chang]the National and Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350100, China
  • [ 8 ] [Lin, Chang]the Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 9 ] [Li, Yang]the National and Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350100, China
  • [ 10 ] [Li, Yang]the Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 11 ] [Liu, Hengshan]Fujian Prima Optoelectronics Company Ltd., Fuzhou; 350000, China
  • [ 12 ] [Zhang, Fan]Fujian Prima Optoelectronics Company Ltd., Fuzhou; 350000, China
  • [ 13 ] [Nie, Junyang]the National and Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350100, China
  • [ 14 ] [Nie, Junyang]the Faculty of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an; 710049, China
  • [ 15 ] [Sun, Jie]the National and Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350100, China
  • [ 16 ] [Sun, Jie]Department of Microscience and Nanotechnology, the Quantum Device Physics Laboratory, Chalmers University of Technology, Goteborg; 41296, Sweden
  • [ 17 ] [Su, Anjun]Haidun Technology Company Ltd., Changsha; 410100, China
  • [ 18 ] [Chen, Nianrui]Haidun Technology Company Ltd., Changsha; 410100, China
  • [ 19 ] [Zhou, Jun]Haidun Technology Company Ltd., Changsha; 410100, China
  • [ 20 ] [Yan, Qun]the National and Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350100, China
  • [ 21 ] [Yan, Qun]the Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 22 ] [Yan, Qun]Rich Sense Electronics Technology Company Ltd., Quanzhou; 362200, China
  • [ 23 ] [Guo, Tailiang]the National and Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350100, China
  • [ 24 ] [Guo, Tailiang]the Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China

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Source :

IEEE Transactions on Electron Devices

ISSN: 0018-9383

Year: 2023

Issue: 12

Volume: 70

Page: 6393-6398

2 . 9

JCR@2023

2 . 9 0 0

JCR@2023

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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