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author:

Lan, Yujie (Lan, Yujie.) [1] | Yang, Lei (Yang, Lei.) [2] | Zhang, Xu (Zhang, Xu.) [3] | Chen, Qingbin (Chen, Qingbin.) [4] (Scholars:陈庆彬) | Zheng, Zaiping (Zheng, Zaiping.) [5]

Indexed by:

EI SCIE

Abstract:

With high power density and high-frequency power electronics technologies, parasitic capacitances of inductors and transformers have been widely discussed, in which parasitic capacitance may lead to electromagnetic interference (EMI) and efficiency performance degradation. Therefore, it is significant to analyze and model the parasitic capacitance of the inductors and transformers. This paper proposes a new parasitic capacitance calculated model of multilayer windings inductors and transformers. Based on the electromagnetic field theory, it can fully consider the edge effect of multilayer inductor windings, including the edge effect between adjacent and non-adjacent layers. Finally, the accuracy of the model is validated by simulation and experiment. Compared with the traditional parasitic capacitance calculated method, the proposed model can calculate the parasitic capacitance more accurately, and the maximum error between calculations and simulations is less than 8%.

Keyword:

edge effect inductor modeling Parasitic capacitance

Community:

  • [ 1 ] [Lan, Yujie]Fuzhou Univ, Sch Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 2 ] [Zhang, Xu]Fuzhou Univ, Sch Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 3 ] [Chen, Qingbin]Fuzhou Univ, Sch Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 4 ] [Yang, Lei]Beijing Inst Precis Mechatron & Controls, Beijing 100076, Peoples R China
  • [ 5 ] [Zheng, Zaiping]Beijing Inst Precis Mechatron & Controls, Beijing 100076, Peoples R China

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Source :

IEEE ACCESS

ISSN: 2169-3536

Year: 2023

Volume: 11

Page: 143182-143189

3 . 4

JCR@2023

3 . 4 0 0

JCR@2023

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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