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author:

Liao, Juan (Liao, Juan.) [1] (Scholars:廖娟) | Zhou, Shaocong (Zhou, Shaocong.) [2] | Xue, Xin (Xue, Xin.) [3] (Scholars:薛新)

Indexed by:

EI Scopus SCIE

Abstract:

With a view to reducing the springback and twist of PEEK during the incremental forming process, the ultrasonic vibration is introduced into polymer thermal single-point incremental forming process (SPIF). In this study, the effects of temperature and ultrasonic vibration on twist and springback of formed parts are investigated. Several modified tool trajectories are developed, and the influence of tool trajectory on twist and springback are also studied. Finally, the microstructures of PEEK parts are analyzed by XRD. The results show that the increase of temperature is helpful to reduce the twist and springback. The ultrasonic vibration is beneficial to the improvement of geometric accuracy, while the side wall bulge aggravates at 140 celcius after the ultrasonic vibration is applied. The optimized tool trajectory can effectively eliminate twist and reduce the springback of PEEK parts. The XRD result shows that the ultrasonic vibration is helpful to increase the molecular chain orientation, improve crystallinity, and refine crystallite at 60 celcius and 100 celcius. However, the opposite trend occurs at 140 celcius due to the disorientation effect of molecular chain.

Keyword:

Molecular chain PEEK Springback Tool trajectory Twist Ultrasonic vibration

Community:

  • [ 1 ] [Liao, Juan]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350116, Peoples R China
  • [ 2 ] [Zhou, Shaocong]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350116, Peoples R China
  • [ 3 ] [Xue, Xin]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350116, Peoples R China

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Source :

INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY

ISSN: 0268-3768

Year: 2022

Issue: 7-8

Volume: 121

Page: 5269-5282

3 . 4

JCR@2022

2 . 9 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:66

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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