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author:

Chen, Shenzhong (Chen, Shenzhong.) [1] | Yu, Jinling (Yu, Jinling.) [2] | Zhu, Kejing (Zhu, Kejing.) [3] | Liu, Qibin (Liu, Qibin.) [4] | Zeng, Xiaolin (Zeng, Xiaolin.) [5] | Chen, Yonghai (Chen, Yonghai.) [6] | Yin, Chunming (Yin, Chunming.) [7] | Cheng, Shuying (Cheng, Shuying.) [8] | Lai, Yunfeng (Lai, Yunfeng.) [9] | He, Ke (He, Ke.) [10]

Indexed by:

EI

Abstract:

Inverse spin Hall effect (ISHE) provides an important way to manipulate and detect spin current via spin–orbit coupling. However, it is difficult to distinguish the ISHE of the top and bottom surface states of topological insulators (TIs). Photo-induced inverse spin Hall effect (PISHE) is a powerful tool to investigate the ISHE of the Dirac surface states of TIs. In this work, PISHE of three-dimensional topological insulators Sb2Te3 with a thickness of 7 and 30 quintuple layer (QL) has been investigated. It is revealed that both of the PISHE currents of the top and bottom surface states are observed in the 7-QL and the 30-QL samples. Besides, a model has been developed to separate the PISHE current of the top and bottom surface states. It is found that the PISHE currents of the top and bottom surface states of the Sb2Te3 films almost do not change with temperature in the range of 77 to 300 K. It is demonstrated that the PISHE current changes linearly with light power, which agrees well with the theoretical model. This study provides a method utilizing circularly polarized light to manipulate and detect the ISHE of the top and bottom surface states of three-dimensional topological insulators. © 2022 Elsevier B.V.

Keyword:

Antimony compounds Crystal symmetry Electric insulators Inverse problems Spin Hall effect Surface states Tellurium compounds Topological insulators Topology

Community:

  • [ 1 ] [Chen, Shenzhong]Institute of Micro/Nano Devices and Solar Cells, School of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 2 ] [Yu, Jinling]Institute of Micro/Nano Devices and Solar Cells, School of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 3 ] [Zhu, Kejing]Department of Physics, State Key Laboratory of Low Dimensional Quantum Physics, Tsinghua University, Beijing; 100084, China
  • [ 4 ] [Liu, Qibin]Institute of Micro/Nano Devices and Solar Cells, School of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 5 ] [Zeng, Xiaolin]Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing; 100083, China
  • [ 6 ] [Chen, Yonghai]Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing; 100083, China
  • [ 7 ] [Chen, Yonghai]College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing; 100049, China
  • [ 8 ] [Yin, Chunming]School of Physics, University of New South Wales, Sydney; NSW; 2052, Australia
  • [ 9 ] [Yin, Chunming]CAS Key Laboratory of Microscale Magnetic Resonance, Department of Modern Physics, Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei; 230026, China
  • [ 10 ] [Cheng, Shuying]Institute of Micro/Nano Devices and Solar Cells, School of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 11 ] [Cheng, Shuying]Jiangsu Collaborative Innovation Center of Photovoltaic Science and Engineering, Changzhou University, Changzhou; Jiangsu; 213164, China
  • [ 12 ] [Lai, Yunfeng]Institute of Micro/Nano Devices and Solar Cells, School of Physics and Information Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 13 ] [He, Ke]Department of Physics, State Key Laboratory of Low Dimensional Quantum Physics, Tsinghua University, Beijing; 100084, China

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Source :

Physica E: Low-Dimensional Systems and Nanostructures

ISSN: 1386-9477

Year: 2022

Volume: 143

3 . 3

JCR@2022

2 . 9 0 0

JCR@2023

ESI HC Threshold:55

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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