Density　functional　theory　calculations　combined　with　experiments　were　performed　to　investigate　the　stability,　crystal　structure,　electronic　structure　and　conductivity　of　RuO2-SiO2　binary　oxides.　Our　calculations　indicate　that　Ru1-xSixO2　solid　solutions　are　unstable,　and　both　their　total　energies　and　lattice　parameters　deviate　from　Vegard＇s　law,　revealing　a　strong　interaction　between　RuO2　and　SiO2.　With　an　increase　in　x　(doping　concentration　of　SiO2),　the　conductivity　of　Ru1-xSixO2　underwent　first-order　exponential　attenuation,　but　the　compound　remained　metallic　even　when　x　was　0.875.　Ru0.5Si0.5O2/Ti　electrodes　were　prepared　using　the　thermal　decomposition　method,　and　at　different　annealing　temperatures,　varying　degrees　of　phase　separation　were　observed　in　all　the　samples,　proving　the　instability　of　the　Ru1-xSixO2　solid　solutions.　The　impedance　test　of　the　Ru0.5Si0.5O2/Ti　samples　showed　that　the　total　impedance　of　the　samples　and　the　degrees　of　phase　separation　conform　to　the　first-order　exponential　relationship.　The　dual　effects　of　Si　doping　attenuation　and　phase　separation　attenuation　can　explain　the　rapid　decline　in　the　conductivity　of　the　RuO2-SiO2　electrode　material.