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author:

Guo, Fan (Guo, Fan.) [1] | Ye, Yun (Ye, Yun.) [2] (Scholars:叶芸) | Hong, Chunyan (Hong, Chunyan.) [3] | Li, Song (Li, Song.) [4] | Hu, Liqin (Hu, Liqin.) [5] | Guo, Tailiang (Guo, Tailiang.) [6] (Scholars:郭太良) | Jiang, Yadong (Jiang, Yadong.) [7]

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Abstract:

The α-Fe2O3 nano-wires were grown on 99% pure iron substrates by thermal oxidation in air. The impacts of growth conditions, including the oxidation temperature and time, on its microstructures and emission properties were evaluated. The nano-wires were characterized with X-ray diffraction, and scanning electron microscopy. The results show that the oxidation temperature and time strongly affect the microstructures and emission characteristics of the nano-wires. For instance, at 600°C, the (110) and (300) preferentially oriented nano-wire were obtained. For a short oxidation time, the nano-flakes dominated;and as the time increased, the nano-wires gradually showed up, growing in number and in length. The aspect ratio and density of the nano-wire, grown at 400°C for 4 h, were found to be optimal for field emission, with an on-set field of 2.3 V/m and a fairly uniform and stable emission.

Keyword:

Aspect ratio Field emission Microstructure Nanowires Oxidation Scanning electron microscopy X ray diffraction

Community:

  • [ 1 ] [Guo, Fan]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Ye, Yun]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 3 ] [Hong, Chunyan]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 4 ] [Li, Song]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 5 ] [Hu, Liqin]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 6 ] [Guo, Tailiang]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 7 ] [Jiang, Yadong]State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

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Source :

Journal of Vacuum Science and Technology

ISSN: 1672-7126

CN: 11-5177/TB

Year: 2013

Issue: 1

Volume: 33

Page: 49-53

Cited Count:

WoS CC Cited Count:

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ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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