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author:

Liu, Xiao-Feng (Liu, Xiao-Feng.) [1] | Wei, Qing-Ke (Wei, Qing-Ke.) [2] | Yu, Jian-Bing (Yu, Jian-Bing.) [3] | Hu, Xiao-Lin (Hu, Xiao-Lin.) [4] (Scholars:胡晓琳) | Zhuang, Nai-Feng (Zhuang, Nai-Feng.) [5] (Scholars:庄乃锋) | Lin, Shu-Kun (Lin, Shu-Kun.) [6] (Scholars:林树坤) | Chen, Jian-Zhong (Chen, Jian-Zhong.) [7] (Scholars:陈建中)

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EI Scopus PKU CSCD

Abstract:

Ba2TiSi2O8 crystals were grown by Czochraski method and the crystal defects were analyzed by SEM and EDS. The results showed that the impurity elements of Na, K, Cl in polycrystalline materials were the main inducements of generating the inclusion defects in as-grown crystal. Lower growth rate and faster rotation velocity were benefit to obtain high-quality BTS crystal. Moreover, the hardness and the optical transmission spectrum were also measured and analyzed.

Keyword:

Crystal defects Crystal growth from melt Crystal impurities Hardness Polycrystalline materials Titanium compounds

Community:

  • [ 1 ] [Liu, Xiao-Feng]College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350116, China
  • [ 2 ] [Wei, Qing-Ke]College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350116, China
  • [ 3 ] [Yu, Jian-Bing]College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350116, China
  • [ 4 ] [Hu, Xiao-Lin]College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350116, China
  • [ 5 ] [Zhuang, Nai-Feng]College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350116, China
  • [ 6 ] [Lin, Shu-Kun]College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350116, China
  • [ 7 ] [Chen, Jian-Zhong]College of Chemistry and Chemical Engineering, Fuzhou University, Fuzhou 350116, China

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Source :

Journal of Synthetic Crystals

ISSN: 1000-985X

CN: 11-2637/O7

Year: 2013

Issue: 12

Volume: 42

Page: 2495-2499,2531

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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