• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Dai, Yuchen (Dai, Yuchen.) [1] | Lin, Jiao (Lin, Jiao.) [2] | Huang, Jianmeng (Huang, Jianmeng.) [3]

Indexed by:

EI

Abstract:

The micro-nanoscopic morphology of the contact surfaces directly affects the tribological behavior between the contact surfaces. In this paper, a single crystal copper substrate with nano rough surfaces is characterized based on the fractal theory, and the nano rough contact model which could exist stably at room temperature (298 K) is established. The contact behavior between rigid plane and elasto-plastic rough substrate is analyzed. It is found that only a few higher asperities enter the contact area at the initial contact stage, causing large fluctuations in contact force. However, due to the small interaction between the asperities, the contact area is approximately linear with the contact force. If the ratio of real contact area to nominal contact area is greater than 17%, the contact force and contact area both increase with the increase of indentation depth, but the contact area-contact force curve deviates from the linear relationship gradually due to the intensification of material deformation and the interaction between asperities. © 2019 Taylor & Francis Group, LLC.

Keyword:

Copper Fractals Morphology Single crystals Surface measurement

Community:

  • [ 1 ] [Dai, Yuchen]College of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 2 ] [Lin, Jiao]College of Energy Engineering, Zhejiang University, Zhejiang, China
  • [ 3 ] [Huang, Jianmeng]College of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, China

Reprint 's Address:

  • [huang, jianmeng]college of mechanical engineering and automation, fuzhou university, fuzhou, china

Show more details

Related Keywords:

Source :

Journal of Dispersion Science and Technology

ISSN: 0193-2691

Year: 2020

Issue: 10

Volume: 41

Page: 1504-1512

2 . 2 6 2

JCR@2020

1 . 9 0 0

JCR@2023

ESI HC Threshold:160

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

Affiliated Colleges:

Online/Total:174/10048016
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1