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author:

Liu, Ming (Liu, Ming.) [1] (Scholars:刘明) | Yang, Shenghan (Yang, Shenghan.) [2] | Gao, Chenghui (Gao, Chenghui.) [3] (Scholars:高诚辉)

Indexed by:

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Abstract:

An automatic dimension measurement method of the scratch images is proposed based on the level set and the anisotropic diffusion. The segmentation and dimension measurement are conducted on scratch images that are obtained by optical microscope. In the segmentation, the distance regularized level set evolution (DRLSE) is used to segment the scratch. The anisotropic diffusion method is utilized instead of Gaussian filtering as the de-noising method of the edge indicating function. The initial level set is manually set and evolved to the whole scratch boundaries. The contour coordinates are achieved by the subpixel adjustment. In the dimension measurement, the scratch boundaries are used to measure the width distribution and scratch length. Meanwhile, the average scratch width and scratch area are obtained. The influence of evolution parameters on measurement results are discussed by experiment. Under the optimal parameters of evolution, the relative measurement errors of the average scratch width and scratch area are less than 0.06% and 0.1%. Compared with the traditional DRLSE, experimental results show that the proposed method has advantages of precision and accuracy in the average scratch width and scratch area. © 2020, Science Press. All right reserved.

Keyword:

Image segmentation Numerical methods Optical anisotropy Optical variables measurement Parameter estimation

Community:

  • [ 1 ] [Liu, Ming]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350116, China
  • [ 2 ] [Yang, Shenghan]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350116, China
  • [ 3 ] [Gao, Chenghui]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou; 350116, China

Reprint 's Address:

  • 刘明

Email:

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Source :

Chinese Journal of Scientific Instrument

ISSN: 0254-3087

CN: 11-2179/TH

Year: 2020

Issue: 2

Volume: 41

Page: 184-194

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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