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author:

Yang, Xiaohua (Yang, Xiaohua.) [1] (Scholars:杨晓华) | Li, Xiaoyan (Li, Xiaoyan.) [2] | Dui, Weizhen (Dui, Weizhen.) [3] (Scholars:兑卫真)

Indexed by:

CPCI-S

Abstract:

The scallop-like Cu(6)Sn(5) intermetellic compound (IMC) layer formed at the interface of Sn-3.8Ag-0.7Cu/Cu joint as soldered. These IMC layers graw during aging at 150 degrees C. The fracture damage micro-mechanism of the joints is different when they have a different IMC thickness. When the thickness of IMC layer is less than 5.5 mu m, ductile fracture occurred in the solder. When it is more than 9 mu m, brittle fracture occurred between the solder and Cu. Scan Electronic Microscopy micro-analyses show that the fracture at the boundary could occur in one of following positions. One is the interface of Cu(6)Sn(5) intermetallic compound and solder. Another is the cleavage intermetallic compound grains. The more thick the I MC layer, the more brittle the IMC, the lower the strength of the interface. The fracture position moved from solder inner to the interfacial CU(6)Sn(5) IMC layer with the IMC thickness increased. in addition, when aging for 480h, the Ag(3)Sn compound formed between solder and Cu(6)Sn(5) compound. The strength of solder is also decreased during aging. The weakening of the solder matrix is caused by the coarsening of the eutectic solder structures, The weakening of the interfacial I MC layer is caused by the size increase of the I MC grains and the decrease of connecting area of IMC layer and the solder.

Keyword:

Fracture damage Intermetalic Compound Solder joint

Community:

  • [ 1 ] [Yang, Xiaohua]Fuzhou Univ, Instrumentat Anal & Measurement Ctr, Fuzhou 350002, Peoples R China
  • [ 2 ] [Dui, Weizhen]Fuzhou Univ, Instrumentat Anal & Measurement Ctr, Fuzhou 350002, Peoples R China

Reprint 's Address:

  • 杨晓华

    [Yang, Xiaohua]Fuzhou Univ, Instrumentat Anal & Measurement Ctr, Fuzhou 350002, Peoples R China

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Source :

EVALUATION, INSPECTION AND MONITORING OF STRUCTURAL INTEGRITY

Year: 2008

Page: 401-405

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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