Grain　preferential　orientation　of　Ag/Ni　multilayered　films　with　different　layer　thicknesses　teach　Ag　and　Ni　layer　consists　of　5,　8,　20　and　40　atomic　planes　for　different　films　respectively)　have　been　investigated　by　transmission　electron　microscopy.　For　Ag　and　Ni　grains　of　fee　lattice　structure,　there　is　a　dominant　[111]　preferential　orientation　along　the　growth　direction,　the　film　is　mainly　[111]　textured.　But　the　texture　axis　may　deviate　for　about　20　degrees　and　some　extend　of　[121]　texture　may　be　formed　as　the　result.　Increasing　of　the　layer　thickness　restrains　this　axial　deviation　and　enhances　[111]　texture.　The　electron　diffraction　analysis　indicates　that　multilayered　film　may　consist　of　columnar　structure,　Ag　and　Ni　grains　in　each　column　take　the　same　orientation　while　grains　in　adjacent　columns　have　correlated　but　somewhat　different　in-plane　orientations.　At　the　first　stage　of　deposition　of　layers　on　the　glass　substrate,　the　grains　show　preferential　orientation　in　growth　direction　only,　the　in-plane　orientations　are　at　random.　The　in-plane　texture　of　the　film　is　formed　when　the　deposition　is　further　proceeded.