The　grain　preferential　orientation　of　Ag/Ni　multilayered　films　with　different　layer　thickness　is　investigated　by　transmission　electron　microscopy.　For　Ag　and　Ni　grains　of　fcc　lattice　structure,　there　is　a　dominant　[111]　preferential　orientation　along　the　growth　direction,　and　the　film　is　mainly　[111]　textured.　But　the　texture　axis　may　deviate　for　about　20°　and　some　extend　of　〈121〉　texture　may　be　formed.　Increasing　the　layer　thickness　can　restrain　this　axial　deviation　and　enhance　[111]　structure.　The　electron　diffraction　analysis　indicates　that　multilayered　film　may　consist　of　columnar　structure　and　Ag　and　Ni　grains　in　each　column　take　the　same　orientation,　while　grains　in　adjacent　columns　have　correlated　but　somewhat　different　in-plane　orientation.