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author:

Yang, ZX (Yang, ZX.) [1] (Scholars:杨尊先) | Yu, Y (Yu, Y.) [2] | Li, XX (Li, XX.) [3] | Bao, HF (Bao, HF.) [4]

Indexed by:

CPCI-S EI Scopus SCIE

Abstract:

In this paper, the study on silicon nano-mechanical electro-thermal probe array used for high-density storage has been performed. After the introduction of structure and working principle of the NEMS probe, the design of component followed by using both theoretical analysis and finite element analysis (FEA). By using advanced (micro-) nano-machining technology, the piezoresistive sensor and the resistive heater have been integrated on the silicon micro-cantilever and the component has been fabricated. Subsequently, the electro-thermal performance and sensitivity have been tested agreeing well with those simulated. About 31.6 Gb/in(2) surface data-writing density was realized successfully on thin PMMA film by using AFM equipment with optimized thermal writing parameters. (c) 2005 Elsevier Ltd. All rights reserved.

Keyword:

Community:

  • [ 1 ] Fuzhou Univ, Dept Elect Sci & Appl Phys, Fujian 350002, Peoples R China
  • [ 2 ] Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Transducer Technol, Shanghai 200050, Peoples R China

Reprint 's Address:

  • 杨尊先

    [Yang, ZX]Fuzhou Univ, Dept Elect Sci & Appl Phys, Fujian 350002, Peoples R China

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Source :

MICROELECTRONICS RELIABILITY

ISSN: 0026-2714

Year: 2006

Issue: 5-6

Volume: 46

Page: 805-810

0 . 8 1 5

JCR@2006

1 . 6 0 0

JCR@2023

ESI Discipline: ENGINEERING;

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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