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Abstract:
Zn(O,S) films were fabricated by oxidizing ZnS thin films deposited by electron beam evaporation method onto glass substrates at temperatures of 350-500 degrees C for 2 h in an atmosphere of oxygen. The XRD and EDX confirmed that the Zn(O, S) films were obtained successfully. The influence of the oxidization temperature on the optical and electrical properties of the Zn(O, S) thin films was investigated. The experimental results show that the Zn(O, S) thin film oxidized at the temperature of 400 degrees C exhibits better properties than others, with the transmittance of 86% in the visible region, the band gap energy of 3.36 eV and the resistivity of 3.22x10(3) Omega.cm, which makes it a potential buffer layer of solar cell.
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CRYSTAL RESEARCH AND TECHNOLOGY
ISSN: 0232-1300
Year: 2016
Issue: 5
Volume: 51
Page: 354-359
1 . 0
JCR@2016
1 . 5 0 0
JCR@2023
ESI Discipline: CHEMISTRY;
ESI HC Threshold:235
JCR Journal Grade:4
CAS Journal Grade:4
Cited Count:
WoS CC Cited Count: 9
SCOPUS Cited Count: 8
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 3
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