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author:

Yu, J. L. (Yu, J. L..) [1] (Scholars:俞金玲) | Chen, Y. H. (Chen, Y. H..) [2] | Liu, Y. (Liu, Y..) [3] | Cheng, S. Y. (Cheng, S. Y..) [4] (Scholars:程树英)

Indexed by:

Scopus SCIE

Abstract:

Strain state in low-dimensional semiconductor structures has a significant influence on their optical and electrical properties, and strain technology is widely utilized to tailor the physical properties of semiconductor materials and devices, such as to engineer the band gap and the carrier mobility of semiconductor heterostructures. The paper reviews the effect of strain on semiconductor quantum wells (QWs), nanowires, and quantum dots (QDs). The recent researches on the strain distribution and engineering of the physical properties by strain in (In, Ga) As, (In, Ga) P, III-V nitrogen, ZnO and SiGe semiconductor QWs, nanowires and QDs are overviewed.

Keyword:

GaAs GaN Ge InGaAs InGaN InN Nanowires Quantum Dots Quantum Wells Si Strain ZnO

Community:

  • [ 1 ] [Yu, J. L.]Fuzhou Univ, Inst Micro Nano Devices & Solar Cells, Sch Phys & Informat Engn, Fuzhou, Peoples R China
  • [ 2 ] [Cheng, S. Y.]Fuzhou Univ, Inst Micro Nano Devices & Solar Cells, Sch Phys & Informat Engn, Fuzhou, Peoples R China
  • [ 3 ] [Yu, J. L.]Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
  • [ 4 ] [Chen, Y. H.]Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
  • [ 5 ] [Liu, Y.]Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China
  • [ 6 ] [Yu, J. L.]Univ Chinese Acad Sci, Beijing 100083, Peoples R China
  • [ 7 ] [Chen, Y. H.]Univ Chinese Acad Sci, Beijing 100083, Peoples R China
  • [ 8 ] [Liu, Y.]Univ Chinese Acad Sci, Beijing 100083, Peoples R China
  • [ 9 ] [Cheng, S. Y.]Changzhou Univ, Jiangsu Collaborat Innovat Ctr Photovolat Sci & E, Changzhou 213164, Jiangsu, Peoples R China

Reprint 's Address:

  • 俞金玲

    [Yu, J. L.]Fuzhou Univ, Inst Micro Nano Devices & Solar Cells, Sch Phys & Informat Engn, Fuzhou, Peoples R China;;[Yu, J. L.]Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China;;[Chen, Y. H.]Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, Beijing 100083, Peoples R China;;[Yu, J. L.]Univ Chinese Acad Sci, Beijing 100083, Peoples R China;;[Chen, Y. H.]Univ Chinese Acad Sci, Beijing 100083, Peoples R China

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Source :

NANOSCIENCE AND NANOTECHNOLOGY LETTERS

ISSN: 1941-4900

Year: 2017

Issue: 7

Volume: 9

Page: 1066-1082

2 . 9 1 7

JCR@2017

1 . 1 2 8

JCR@2019

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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