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author:

Chen, Pingping (Chen, Pingping.) [1] (Scholars:陈平平) | Cai, Kui (Cai, Kui.) [2] | Zheng, Shi (Zheng, Shi.) [3]

Indexed by:

EI Scopus SCIE

Abstract:

The multi-level-cell (MLC) NAND flash memory exhibits a diversity of the raw bit error rate (BER) over different program/erase (P/E) cycles and different types of bits within a memory cell. In this letter, we first apply a protograph-based extrinsic information transfer chart analysis to the MLC flash channel and design novel rate-adaptive protograph low-density parity-check (RAP-LDPC) codes by using a code extension approach. The proposed RAP-LDPC code has multiple code rates, which can be adapted dynamically to different P/E cycles. To mitigate the unbalanced raw BERs between different types of bits within a memory cell, we further propose an optimum mapping between the variable nodes of the protograph and different types of bits of the memory cell. Since the proposed RAP-LDPC codes are based on the same parity-check matrix with specific structure, a single protograph encoder/decoder is sufficient to handle all the code rates. Simulation results demonstrate that the proposed RAP-LDPC codes with optimum mapping outperform the irregular LDPC codes for all the code rates with a faster decoding convergence speed for the MLC flash channel.

Keyword:

extrinsic information transfer chart (EXIT) analysis Multi-level-cell (MLC) NAND flash memory protograph code rate-adaptive low-density parity-check (LDPC) code

Community:

  • [ 1 ] [Chen, Pingping]Singapore Univ Technol & Design, Dept Sci, Singapore 487372, Singapore
  • [ 2 ] [Cai, Kui]Singapore Univ Technol & Design, Dept Sci, Singapore 487372, Singapore
  • [ 3 ] [Chen, Pingping]Fuzhou Univ, Coll Phys & Informat, Xiamen 361005, Fujian, Peoples R China
  • [ 4 ] [Zheng, Shi]Zhejiang Univ, Coll Elect Engn, Hangzhou 310058, Zhejiang, Peoples R China

Reprint 's Address:

  • 陈平平

    [Chen, Pingping]Singapore Univ Technol & Design, Dept Sci, Singapore 487372, Singapore

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Source :

IEEE COMMUNICATIONS LETTERS

ISSN: 1089-7798

Year: 2018

Issue: 6

Volume: 22

Page: 1112-1115

3 . 4 5 7

JCR@2018

3 . 7 0 0

JCR@2023

ESI Discipline: COMPUTER SCIENCE;

ESI HC Threshold:174

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 28

SCOPUS Cited Count: 33

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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