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author:

Chen, Pingping (Chen, Pingping.) [1] | Cai, Kui (Cai, Kui.) [2] | Zheng, Shi (Zheng, Shi.) [3]

Indexed by:

EI

Abstract:

The multi-level-cell (MLC) NAND flash memory exhibits a diversity of the raw bit error rate (BER) over different program/erase (P/E) cycles and different types of bits within a memory cell. In this letter, we first apply a protograph-based extrinsic information transfer chart analysis to the MLC flash channel and design novel rate-adaptive protograph low-density parity-check (RAP-LDPC) codes by using a code extension approach. The proposed RAP-LDPC code has multiple code rates, which can be adapted dynamically to different P/E cycles. To mitigate the unbalanced raw BERs between different types of bits within a memory cell, we further propose an optimum mapping between the variable nodes of the protograph and different types of bits of the memory cell. Since the proposed RAP-LDPC codes are based on the same parity-check matrix with specific structure, a single protograph encoder/decoder is sufficient to handle all the code rates. Simulation results demonstrate that the proposed RAP-LDPC codes with optimum mapping outperform the irregular LDPC codes for all the code rates with a faster decoding convergence speed for the MLC flash channel. © 1997-2012 IEEE.

Keyword:

Bit error rate Cells Codes (symbols) Cytology Flash memory Forward error correction Mapping Matrix algebra Memory architecture NAND circuits Semiconductor storage

Community:

  • [ 1 ] [Chen, Pingping]Department of Science, Singapore University of Technology and Design, Singapore; 487372, Singapore
  • [ 2 ] [Chen, Pingping]College of Physics and Information, Fuzhou University, Fujian; 361005, China
  • [ 3 ] [Cai, Kui]Department of Science, Singapore University of Technology and Design, Singapore; 487372, Singapore
  • [ 4 ] [Zheng, Shi]College of Electrical Engineering, Zhejiang University, Zhejiang; 310058, China

Reprint 's Address:

  • [chen, pingping]college of physics and information, fuzhou university, fujian; 361005, china;;[chen, pingping]department of science, singapore university of technology and design, singapore; 487372, singapore

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Source :

IEEE Communications Letters

ISSN: 1089-7798

Year: 2018

Issue: 6

Volume: 22

Page: 1112-1115

3 . 4 5 7

JCR@2018

3 . 7 0 0

JCR@2023

ESI HC Threshold:174

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 33

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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