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author:

Wei, Rongshan (Wei, Rongshan.) [1] (Scholars:魏榕山) | Liu, Zhangwang (Liu, Zhangwang.) [2] | Zhu, Rui (Zhu, Rui.) [3]

Indexed by:

EI Scopus SCIE

Abstract:

This paper presents a low noise and residual offset chopper-stabilized precision instrumentation amplifier intended for use in measurement systems. Conventional chopper-stabilized instrumentation amplifier introduces a necessary trade-off between the low residual offset and noise provided by a high-transconductance input stage and the resulting high residual ripple. However, to achieve low noise and residual offset, the proposed chopper-stabilized instrumentation amplifier employs a relatively high-transconductance input stage to reduce the offset and 1/f noise, and uses a switched-capacitor notch filter as low-pass filter to filter out the chopper ripple caused by the up-modulated offset and 1/f noise, and introduces a ripple reduction loop (RRL) to reduce the resulting high residual ripple amplitude. The complete chopper-stabilized instrumentation amplifier is implemented in a standard 0.18 mu m CMOS technology. It occupies an area of approximately 1.2 mm(2) and consumes 75 mu A current from a 1.6 V supply voltage. The input-referred noise power spectral density is 20 nV/aeHz and its residual offset is less than 4 mu V. The RRL achieves a ripple rejection ratio of 26 dB.

Keyword:

Chopper-stabilized Low noise Low residual offset Precision instrumentation amplifier Ripple reduction loop (RRL)

Community:

  • [ 1 ] [Wei, Rongshan]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350116, Fujian, Peoples R China
  • [ 2 ] [Liu, Zhangwang]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350116, Fujian, Peoples R China
  • [ 3 ] [Zhu, Rui]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350116, Fujian, Peoples R China

Reprint 's Address:

  • 魏榕山

    [Wei, Rongshan]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350116, Fujian, Peoples R China

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Source :

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING

ISSN: 0925-1030

Year: 2018

Issue: 3

Volume: 96

Page: 521-529

0 . 8 2 3

JCR@2018

1 . 2 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:170

JCR Journal Grade:4

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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