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author:

Gu, Tianqi (Gu, Tianqi.) [1] (Scholars:顾天奇) | Tu, Yi (Tu, Yi.) [2] | Tang, Dawei (Tang, Dawei.) [3] | Luo, Tianzhi (Luo, Tianzhi.) [4]

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EI Scopus SCIE

Abstract:

The moving least-squares (MLS) and moving total least-squares (MTLS) methods have been widely used for fitting measurement data. They can be used to achieve good approximation properties. However, these two methods are susceptible to outliers due to the way of determining local approximate coefficients, which leads to distorted estimation. To reduce the influence of outliers and random errors of all variables without adding small weights or setting the threshold subjectively, we present a robust MTLS (RMTLS) method, in which an improved least trimmed squares (ILTS) method is used for obtaining the local approximants of the influence domain. The ILTS method divides the nodes in the influence domain into a certain number of subsamples, achieves the local approximants by the total least-squares (TLS) method with compact support weight function, and trims the node with the largest orthogonal residual from each subsample, respectively. The remaining nodes from the subsamples are used to determine the local coefficients. The measurement experiment and numerical simulations are provided to demonstrate the robustness and accuracy of the presented method in comparison with the MLS and MTLS methods.

Keyword:

Distortion measurement Estimation Finite element analysis Fitting Least trimmed squares (LTS) moving total least-squares (MTLS) Numerical simulation outliers Pollution measurement random errors Reconstruction algorithms

Community:

  • [ 1 ] [Gu, Tianqi]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 2 ] [Tu, Yi]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 3 ] [Tang, Dawei]Univ Huddersfield, Ctr Precis Technol, Huddersfield HD1 3DH, W Yorkshire, England
  • [ 4 ] [Luo, Tianzhi]Univ Sci & Technol China, Dept Modern Mech, Hefei 230022, Peoples R China

Reprint 's Address:

  • [Luo, Tianzhi]Univ Sci & Technol China, Dept Modern Mech, Hefei 230022, Peoples R China

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Source :

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

ISSN: 0018-9456

Year: 2020

Issue: 10

Volume: 69

Page: 7566-7573

4 . 0 1 6

JCR@2020

5 . 6 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:132

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 18

SCOPUS Cited Count: 18

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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