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author:

Gu, Tianqi (Gu, Tianqi.) [1] | Tu, Yi (Tu, Yi.) [2] | Tang, Dawei (Tang, Dawei.) [3] | Luo, Tianzhi (Luo, Tianzhi.) [4]

Indexed by:

EI

Abstract:

The moving least-squares (MLS) and moving total least-squares (MTLS) methods have been widely used for fitting measurement data. They can be used to achieve good approximation properties. However, these two methods are susceptible to outliers due to the way of determining local approximate coefficients, which leads to distorted estimation. To reduce the influence of outliers and random errors of all variables without adding small weights or setting the threshold subjectively, we present a robust MTLS (RMTLS) method, in which an improved least trimmed squares (ILTS) method is used for obtaining the local approximants of the influence domain. The ILTS method divides the nodes in the influence domain into a certain number of subsamples, achieves the local approximants by the total least-squares (TLS) method with compact support weight function, and trims the node with the largest orthogonal residual from each subsample, respectively. The remaining nodes from the subsamples are used to determine the local coefficients. The measurement experiment and numerical simulations are provided to demonstrate the robustness and accuracy of the presented method in comparison with the MLS and MTLS methods. © 1963-2012 IEEE.

Keyword:

Least squares approximations Numerical methods Orthogonal functions Random errors Statistics

Community:

  • [ 1 ] [Gu, Tianqi]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 2 ] [Tu, Yi]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 3 ] [Tang, Dawei]Centre for Precision Technologies, University of Huddersfield, Huddersfield, United Kingdom
  • [ 4 ] [Luo, Tianzhi]Department of Modern Mechanics, University of Science and Technology of China, Hefei, China

Reprint 's Address:

  • [luo, tianzhi]department of modern mechanics, university of science and technology of china, hefei, china

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Source :

IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Year: 2020

Issue: 10

Volume: 69

Page: 7566-7573

4 . 0 1 6

JCR@2020

5 . 6 0 0

JCR@2023

ESI HC Threshold:132

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 14

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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