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author:

Gu, Tianqi (Gu, Tianqi.) [1] (Scholars:顾天奇) | Hu, Chenjie (Hu, Chenjie.) [2] | Tang, Dawei (Tang, Dawei.) [3] | Luo, Tianzhi (Luo, Tianzhi.) [4]

Indexed by:

SCIE

Abstract:

Reconstruction methods for discrete data, such as the Moving Least Squares (MLS) and Moving Total Least Squares (MTLS), have made a great many achievements with the progress of modern industrial technology. Although the MLS and MTLS have good approximation accuracy, neither of these two approaches are robust model reconstruction methods and the outliers in the data cannot be processed effectively as the construction principle results in distorted local approximation. This paper proposes an improved method that is called the Moving Total Least Trimmed Squares (MTLTS) to achieve more accurate and robust estimations. By applying the Total Least Trimmed Squares (TLTS) method to the orthogonal construction way in the proposed MTLTS, the outliers as well as the random errors of all variables that exist in the measurement data can be effectively suppressed. The results of the numerical simulation and measurement experiment show that the proposed algorithm is superior to the MTLS and MLS method from the perspective of robustness and accuracy.

Keyword:

Moving Least Squares outliers reconstruction method surface profile

Community:

  • [ 1 ] [Gu, Tianqi]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 2 ] [Hu, Chenjie]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 3 ] [Tang, Dawei]Univ Huddersfield, Ctr Precis Technol, Huddersfield HD1 3DH, W Yorkshire, England
  • [ 4 ] [Luo, Tianzhi]Univ Sci & Technol China, Dept Modern Mech, CAS Key Lab Mech Behav & Design Mat, Hefei 230022, Peoples R China

Reprint 's Address:

  • [Luo, Tianzhi]Univ Sci & Technol China, Dept Modern Mech, CAS Key Lab Mech Behav & Design Mat, Hefei 230022, Peoples R China

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Source :

SENSORS

ISSN: 1424-8220

Year: 2020

Issue: 22

Volume: 20

3 . 5 7 6

JCR@2020

3 . 4 0 0

JCR@2023

ESI Discipline: CHEMISTRY;

ESI HC Threshold:160

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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