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author:

Han, Xueli (Han, Xueli.) [1] | Xu, Xiaorui (Xu, Xiaorui.) [2] | Wang, Zhengbo (Wang, Zhengbo.) [3] | Yang, Hanchao (Yang, Hanchao.) [4] | Chen, Desen (Chen, Desen.) [5] | Deng, Yicong (Deng, Yicong.) [6] | Chen, Duanyang (Chen, Duanyang.) [7] | Zhang, Haizhong (Zhang, Haizhong.) [8] (Scholars:张海忠) | Qi, Hongji (Qi, Hongji.) [9]

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EI

Abstract:

In this paper, a vertical Ga2O3 Schottky barrier diode (SBD) with nitrogen (N)-doped protecting ring and mesa termination (NMT-SBD) is fabricated. In addition to the electric field optimization effect of the mesa termination, the NMT-SBD also features the N-doped protecting ring to reduce the electric field near the anode edge. This further increases the breakdown voltage (BV) and enables the Ni/Ga2O3 contact with a low barrier height to be used as the anode, leading to a low forward voltage (VF). The experimental results show that the device achieves a BV of 2.87 kV and a specific on resistance of 3.68 mΩ cm2, resulting in a high power figure of merit of 2.24 GW/cm2. Furthermore, the device exhibits a low VF (@100 A/cm2) of 1.3 V, confirming its excellent performance with low conduction loss. This work demonstrates a promising strategy for fabricating high-power Ga2O3 vertical Schottky barrier diode. © 2025 Author(s).

Keyword:

Anode materials Anodes Doping (additives) Electric fields Gallium compounds Nickel compounds Nitrogen

Community:

  • [ 1 ] [Han, Xueli]China Advanced Laser and Optoelectronic Functional Materials Department, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai; 201800, China
  • [ 2 ] [Han, Xueli]The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing; 100049, China
  • [ 3 ] [Xu, Xiaorui]The College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 4 ] [Wang, Zhengbo]China Advanced Laser and Optoelectronic Functional Materials Department, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai; 201800, China
  • [ 5 ] [Wang, Zhengbo]The Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing; 100049, China
  • [ 6 ] [Yang, Hanchao]The College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 7 ] [Chen, Desen]The College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 8 ] [Deng, Yicong]The College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 9 ] [Chen, Duanyang]China Advanced Laser and Optoelectronic Functional Materials Department, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai; 201800, China
  • [ 10 ] [Zhang, Haizhong]The College of Physics and Information Engineering, Fuzhou University, Fuzhou; 350116, China
  • [ 11 ] [Qi, Hongji]China Advanced Laser and Optoelectronic Functional Materials Department, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai; 201800, China
  • [ 12 ] [Qi, Hongji]The Hangzhou Institute of Optics and Fine Mechanics, Hangzhou; 311421, China

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Source :

Applied Physics Letters

ISSN: 0003-6951

Year: 2025

Issue: 3

Volume: 127

3 . 5 0 0

JCR@2023

Cited Count:

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SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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