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author:

Han, Xueli (Han, Xueli.) [1] | Xu, Xiaorui (Xu, Xiaorui.) [2] | Wang, Zhengbo (Wang, Zhengbo.) [3] | Yang, Hanchao (Yang, Hanchao.) [4] | Chen, Desen (Chen, Desen.) [5] | Deng, Yicong (Deng, Yicong.) [6] | Chen, Duanyang (Chen, Duanyang.) [7] | Zhang, Haizhong (Zhang, Haizhong.) [8] | Qi, Hongji (Qi, Hongji.) [9]

Indexed by:

SCIE

Abstract:

In this work, a vertical gallium oxide (Ga2O3) Schottky barrier diode (SBD) with suspended field plate-assisted shallow mesa termination (SFPM-SBD) is proposed and fabricated. The suspended field plate is achieved by using Cl-2 in the ICP etching process to facilitate isotropic etching of Ga2O3. Compared with shallow mesa SBD, the introduction of SFPM can further optimize the electric field (E_Field) distribution. Consequently, a high breakdown voltage (BV) of over 3.5 kV and a low specific ON-resistance of 5.77 m Omega & sdot;cm(2) are achieved, resulting in a power figure of merit (PFOM) >2.12 GW/cm(2). Furthermore, the large-area device with 3 x 3 mm(2) is fabricated, achieving a BV exceeding 1.5 kV and a high forward current of 12 A at 2 V. The simplified fabrication process of the SFPM-SBD, combined with its outstanding performance, makes it a promising candidate for multikilovolt and ampere-class applications.

Keyword:

Anodes Electric breakdown Electric field (E_Field) management Etching Fabrication gallium oxide (Ga2O3) Laser theory Leakage currents Optics Power lasers Schottky barrier diode (SBD) Schottky barriers Schottky diodes termination

Community:

  • [ 1 ] [Han, Xueli]Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China
  • [ 2 ] [Wang, Zhengbo]Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China
  • [ 3 ] [Chen, Duanyang]Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China
  • [ 4 ] [Qi, Hongji]Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China
  • [ 5 ] [Han, Xueli]Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
  • [ 6 ] [Wang, Zhengbo]Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China
  • [ 7 ] [Xu, Xiaorui]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350116, Peoples R China
  • [ 8 ] [Yang, Hanchao]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350116, Peoples R China
  • [ 9 ] [Chen, Desen]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350116, Peoples R China
  • [ 10 ] [Deng, Yicong]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350116, Peoples R China
  • [ 11 ] [Zhang, Haizhong]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350116, Peoples R China
  • [ 12 ] [Qi, Hongji]Hangzhou Inst Opt & Fine Mech, Hangzhou 311421, Peoples R China

Reprint 's Address:

  • [Chen, Duanyang]Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China;;[Qi, Hongji]Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China;;[Xu, Xiaorui]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350116, Peoples R China

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Source :

IEEE TRANSACTIONS ON ELECTRON DEVICES

ISSN: 0018-9383

Year: 2025

2 . 9 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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