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author:

Qiu, S. (Qiu, S..) [1] | Yang, C.-H. (Yang, C.-H..) [2] | Wu, L. (Wu, L..) [3] | Song, W. (Song, W..) [4] | Pan, J.-Z. (Pan, J.-Z..) [5]

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Scopus

Abstract:

In this study, we propose a reparameterization You-Only-Look-Once v5 (YOLOv5) algorithm model for strip-steel surface defect detection to address low precision and poor timeliness in traditional methods. The proposed model introduces a re-parameterized VGG Light module, an enhanced bidirectional feature pyramid network feature structure, and a bounding box regression loss function fused with a normalized Gaussian-Wasserstein distance metric to improve small-target-defect detection accuracy. The experimental findings reveal a mean average precision (mAP) of 82.1% on the NEU-DET dataset, representing a notable improvement of 4.1% over the baseline YOLOv5s algorithm. Furthermore, the proposed algorithm model demonstrates superior detection accuracy compared with other prevalent object detection models and effectively mitigates challenges such as false detections and missed detections of small targets. Notably, it achieves an impressive detection speed of 68 FPS, affirming its efficacy in real-time applications.  © 2024 MYU K.K.

Keyword:

bidirectional feature pyramid network (BiFPN) normalized Gaussian-Wasserstein distance (NGWD) RepVGG-Light module surface defect detection

Community:

  • [ 1 ] [Qiu S.]School of Mechanical and Electric Engineering, Sanming University, Fujian Province, Sanming, 365004, China
  • [ 2 ] [Yang C.-H.]School of Mechanical and Electric Engineering, Sanming University, Fujian Province, Sanming, 365004, China
  • [ 3 ] [Wu L.]School of Mechanical and Electric Engineering, Sanming University, Fujian Province, Sanming, 365004, China
  • [ 4 ] [Song W.]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, 350000, China
  • [ 5 ] [Pan J.-Z.]Fujian Sansteel (Group) Co. Ltd., Fujian Province, Sanming, 365004, China
  • [ 6 ] [Pan J.-Z.]School of Material Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, China

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Source :

Sensors and Materials

ISSN: 0914-4935

Year: 2024

Issue: 11

Volume: 36

Page: 4881-4902

1 . 0 0 0

JCR@2023

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ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 1

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