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author:

Qiu, Sijie (Qiu, Sijie.) [1] | Yang, Chi-Hsin (Yang, Chi-Hsin.) [2] | Wu, Long (Wu, Long.) [3] | Song, Wenqi (Song, Wenqi.) [4] | Pan, Jian-Zhou (Pan, Jian-Zhou.) [5]

Indexed by:

Scopus SCIE

Abstract:

In this study, we propose a reparameterization You-Only-Look-Once v5 (YOLOv5) algorithm model for strip-steel surface defect detection to address low precision and poor timeliness in traditional methods. The proposed model introduces a re-parameterized VGG Light module, an enhanced bidirectional feature pyramid network feature structure, and a bounding box regression loss function fused with a normalized Gaussian-Wasserstein distance metric to improve small-target-defect detection accuracy. The experimental findings reveal a mean average precision (mAP) of 82.1% on the NEU-DET dataset, representing a notable improvement of 4.1% over the baseline YOLOv5s algorithm. Furthermore, the proposed algorithm model demonstrates superior detection accuracy compared with other prevalent object detection models and effectively mitigates challenges such as false detections and missed detections of small targets. Notably, it achieves an impressive detection speed of 68 FPS, affirming its efficacy in real-time applications.

Keyword:

bidirectional feature pyramid network (BiFPN) normalized Gaussian-Wasserstein distance (NGWD) RepVGG-Light module surface defect detection

Community:

  • [ 1 ] [Qiu, Sijie]Sanming Univ, Sch Mech & Elect Engn, Sanming 365004, Fujian, Peoples R China
  • [ 2 ] [Yang, Chi-Hsin]Sanming Univ, Sch Mech & Elect Engn, Sanming 365004, Fujian, Peoples R China
  • [ 3 ] [Wu, Long]Sanming Univ, Sch Mech & Elect Engn, Sanming 365004, Fujian, Peoples R China
  • [ 4 ] [Song, Wenqi]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350000, Peoples R China
  • [ 5 ] [Pan, Jian-Zhou]Fujian Sansteel Grp Co Ltd, Sanming 365004, Fujian, Peoples R China
  • [ 6 ] [Pan, Jian-Zhou]Univ Sci & Technol Beijing, Sch Mat Sci & Engn, Beijing 100083, Peoples R China

Reprint 's Address:

  • [Yang, Chi-Hsin]Sanming Univ, Sch Mech & Elect Engn, Sanming 365004, Fujian, Peoples R China

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Source :

SENSORS AND MATERIALS

ISSN: 0914-4935

Year: 2024

Issue: 11

Volume: 36

Page: 4881-4902

1 . 0 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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