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author:

Zeng, Xiangfu (Zeng, Xiangfu.) [1] | Jiang, Xingan (Jiang, Xingan.) [2] | Lin, Jinfeng (Lin, Jinfeng.) [3] | Lin, Qifa (Lin, Qifa.) [4] | Wang, Simin (Wang, Simin.) [5] | Wu, Yourong (Wu, Yourong.) [6] | Wu, Xiao (Wu, Xiao.) [7] | Gao, Min (Gao, Min.) [8] | Zhao, Chunlin (Zhao, Chunlin.) [9] | Lin, Tengfei (Lin, Tengfei.) [10] | Luo, Laihui (Luo, Laihui.) [11] | Lin, Cong (Lin, Cong.) [12]

Indexed by:

EI

Abstract:

Transparent dielectric ceramics with ultrafast discharge rates and gigantic power densities are ideal candidates for transparent pulse capacitors (TPCs). However, the requirement of a high external electric field and inferior temperature stability hinder practical applications. (Bi0.5Na0.5)TiO3-based ceramics exhibit large polarization and two characteristic dielectric peaks, easy to obtain high energy-storage density under low electric fields (low-E) and maintain stable energy-storage performance (ESP) within a wide temperature range. However, their low optical transmittance (T%) limits their development into TPCs. In this work, to concurrently obtain high T% and excellent ESP and stability under low-E conditions, we propose a collaborative optimization strategy for determining the regulations of grain size, bandgap energy and domain structure. The results show that the pellucidity and energy-storage characteristics improve with decreasing grain and domain sizes. A relatively high T% of 45.6 % (at 710 nm) and recoverable energy-storage density (Wrec ∼ 3.46 J cm−3 at 197 kV cm−1) are obtained for the (1-x)[0.85(Bi0.5-3yNa0.5-yYb3yHoyTiO3)-0.15SrZrO3]-xBaHfO3 ceramics. Additionally, the dielectric temperature stability also results in splendid storage temperature stability (ΔWrec/Wrec © 2024

Keyword:

Energy storage Fluorescence Optoelectronic devices Stability Temperature sensors

Community:

  • [ 1 ] [Zeng, Xiangfu]Institute of Advanced Ceramics, College of Materials Science and Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 2 ] [Jiang, Xingan]Institute of Micro/Nano Materials and Devices, Ningbo University of Technology, Ningbo; 315211, China
  • [ 3 ] [Lin, Jinfeng]Strait Institute of Flexible Electronics (SIFE, Future Technologies), Fujian Key Laboratory of Flexible Electronics, Fujian Normal University and Strait Laboratory of Flexible Electronics (SLoFE), Fuzhou; 350117, China
  • [ 4 ] [Lin, Jinfeng]Key Laboratory of Advanced Civil Engineering Materials of Ministry of Education, Functional Materials Research Laboratory, School of Materials Science and Engineering, Tongji University, Shanghai; 201804, China
  • [ 5 ] [Lin, Qifa]Institute of Advanced Ceramics, College of Materials Science and Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 6 ] [Wang, Simin]Strait Institute of Flexible Electronics (SIFE, Future Technologies), Fujian Key Laboratory of Flexible Electronics, Fujian Normal University and Strait Laboratory of Flexible Electronics (SLoFE), Fuzhou; 350117, China
  • [ 7 ] [Wu, Yourong]Institute of Advanced Ceramics, College of Materials Science and Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 8 ] [Wu, Xiao]Institute of Advanced Ceramics, College of Materials Science and Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 9 ] [Gao, Min]Institute of Advanced Ceramics, College of Materials Science and Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 10 ] [Zhao, Chunlin]Institute of Advanced Ceramics, College of Materials Science and Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 11 ] [Lin, Tengfei]Institute of Advanced Ceramics, College of Materials Science and Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 12 ] [Luo, Laihui]Department of Microelectronic Science and Engineering, Ningbo University, Ningbo; 315211, China
  • [ 13 ] [Lin, Cong]Institute of Advanced Ceramics, College of Materials Science and Engineering, Fuzhou University, Fuzhou; 350108, China

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Source :

Chemical Engineering Journal

ISSN: 1385-8947

Year: 2024

Volume: 496

1 3 . 4 0 0

JCR@2023

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ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 1

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