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author:

Han, Jiuyuan (Han, Jiuyuan.) [1] | Shi, Rengang (Shi, Rengang.) [2] | Ren, Yingjie (Ren, Yingjie.) [3] | Cao, Lei (Cao, Lei.) [4] | Wang, Liang (Wang, Liang.) [5] | Zhou, Tao (Zhou, Tao.) [6] | Yu, Xueqing (Yu, Xueqing.) [7] | Mao, Minmin (Mao, Minmin.) [8] | Bafrooei, Hadi Barzegar (Bafrooei, Hadi Barzegar.) [9] | Liu, Bing (Liu, Bing.) [10] | Lu, Zhilun (Lu, Zhilun.) [11] | Taheri-Nassaj, Ehsan (Taheri-Nassaj, Ehsan.) [12] | Zheng, Xinghua (Zheng, Xinghua.) [13] (Scholars:郑兴华) | Lin, Huixing (Lin, Huixing.) [14] | Song, Kaixin (Song, Kaixin.) [15]

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Abstract:

In this paper, a strategy for preparing MgAl2-x(Mg0.5Ge0.5)xO4 (0 ≤ x ≤ 0.12) solid solution ceramics through the substitution of (Mg0.5Ge0.5)3+ for Al3+ in the octahedral lattice of spinel crystal structure A(tetra)B2(octa)O4 via traditional high-temperature solid-state reaction method is presented. The intrinsic and extrinsic factors influencing their microwave dielectric properties, including the inversion degree of A/B lattice sites (lattice occupancy), bond length and bond valence, as well as grain sizes, were investigated using Rietveld refinement of X-ray powder diffraction data and scanning electron microscopy. To verify the applicability for the next-generation 5 G-n257/n258 millimeter wave frequency band, the Q×f values were tested within the frequency range of 12–25 GHz. Notably, MgAl1.91(Mg0.5Ge0.5)0.09O4 ceramics exhibited a high Q×f value of 105, 384 GHz @11.83 GHz, low Εr of 8.7, and τf of −66.4 ppm/℃. SrTiO3 was added to tune the τf to a near-zero value of +2.6 ppm/℃ with high Q×f value of 51, 152 GHz @11.53 GHz and Εr of 9.91. Finally, a microstrip filter with a center frequency of 3.6 GHz was designed using this composite ceramic, successfully demonstrating its practical application in the low-frequency band of 5 G networks. © 2024 Elsevier Ltd

Keyword:

Bond length Crystal structure Dielectric materials Dielectric properties Magnesium compounds Microwave filters Millimeter waves Rietveld refinement Scanning electron microscopy Solid state reactions Titanium compounds X ray powder diffraction

Community:

  • [ 1 ] [Han, Jiuyuan]College of Electronics Information, Hangzhou Dianzi University, Hangzhou; 310018, China
  • [ 2 ] [Shi, Rengang]College of Electronics Information, Hangzhou Dianzi University, Hangzhou; 310018, China
  • [ 3 ] [Ren, Yingjie]Institute of Communication Materials, Zhejiang Wazam New Materials Co., Ltd, Hangzhou; 311121, China
  • [ 4 ] [Cao, Lei]College of Electronics Information, Hangzhou Dianzi University, Hangzhou; 310018, China
  • [ 5 ] [Wang, Liang]Institute of Communication Materials, Zhejiang Wazam New Materials Co., Ltd, Hangzhou; 311121, China
  • [ 6 ] [Zhou, Tao]College of Electronics Information, Hangzhou Dianzi University, Hangzhou; 310018, China
  • [ 7 ] [Yu, Xueqing]College of Electronics Information, Hangzhou Dianzi University, Hangzhou; 310018, China
  • [ 8 ] [Mao, Minmin]College of Electronics Information, Hangzhou Dianzi University, Hangzhou; 310018, China
  • [ 9 ] [Bafrooei, Hadi Barzegar]College of Electronics Information, Hangzhou Dianzi University, Hangzhou; 310018, China
  • [ 10 ] [Liu, Bing]College of Electronics Information, Hangzhou Dianzi University, Hangzhou; 310018, China
  • [ 11 ] [Lu, Zhilun]School of Chemical and Process Engineering, University of Leeds, Leeds; LS2 9JT, United Kingdom
  • [ 12 ] [Taheri-Nassaj, Ehsan]Department of Materials Engineering, Tarbiat Modares University, Tehran; 14115-143, Iran
  • [ 13 ] [Zheng, Xinghua]Institute of Advanced Ceramics, College of Materials Science and Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 14 ] [Lin, Huixing]Shanghai Institute of Ceramics, Chinese Academy of Science, Shanghai; 201899, China
  • [ 15 ] [Song, Kaixin]College of Electronics Information, Hangzhou Dianzi University, Hangzhou; 310018, China

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Source :

Journal of the European Ceramic Society

ISSN: 0955-2219

Year: 2024

Issue: 15

Volume: 44

5 . 8 0 0

JCR@2023

Cited Count:

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SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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