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author:

Zhu, Y. (Zhu, Y..) [1] | Xu, Z. (Xu, Z..) [2] | Lin, Y. (Lin, Y..) [3] | Chen, D. (Chen, D..) [4] | Zheng, K. (Zheng, K..) [5] | Yuan, Y. (Yuan, Y..) [6]

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Scopus

Abstract:

Surface defect detection of sawn timber is a critical task to ensure the quality of wooden products. Current methods have challenges in considering detection accuracy and speed simultaneously, due to the complexity of defects and the massive length of sawn timbers. Specifically, there are scale variation, large intraclass difference and high interclass similarity in the defects, which reduce the detection accuracy. To overcome these challenges, we propose an efficient multilevel-feature integration network (EMINet) based on YOLOv5s. To obtain discriminative features of defects, the cross fusion module (CFM) is proposed to fully integrate the multilevel features of backbone. In the CFM, the local information aggregation is designed to enrich the detailed information of high-level features, and the global information aggregation is designed to enhance the semantic information of low-level features. Experimental results demonstrate that the proposed EMINet achieves better accuracy with fast speed compared with the state-of-the-art methods. © 2024 IOP Publishing Ltd.

Keyword:

information aggregation machine vision multilevel feature integration sawn timber surface defect detection

Community:

  • [ 1 ] [Zhu Y.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 2 ] [Xu Z.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 3 ] [Lin Y.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 4 ] [Chen D.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 5 ] [Zheng K.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 6 ] [Yuan Y.]School of Electrical Engineering, Yanshan University, Qinhuangdao, 066004, China

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Source :

Measurement Science and Technology

ISSN: 0957-0233

Year: 2024

Issue: 4

Volume: 35

2 . 7 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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