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author:

Zhu, Xiaoqian (Zhu, Xiaoqian.) [1] | Li, Yuhang (Li, Yuhang.) [2] | Zhou, Yuanxiang (Zhou, Yuanxiang.) [3] | Zhang, Yunxiao (Zhang, Yunxiao.) [4] (Scholars:张云霄) | Liu, Xuanhao (Liu, Xuanhao.) [5] | Chen, Ming (Chen, Ming.) [6]

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EI Scopus SCIE

Abstract:

Improving the electrical treeing resistance of polymer is of great significance for insulation reliability. To achieve this, a solution-based method is employed to introduce a voltage stabilizer with high electron affinity into the silicone rubber (SiR). Experimental findings demonstrate the voltage stabilizer's ability to improve the tree initiation voltage and provide evidence of their migration within the SiR. Additionally, by combining a finite element method, it has been confirmed that voltage stabilizers can migrate through dielectrophoresis in non-uniform electric fields and adaptively reposition themselves in response to changes in electric field distribution during the growth of the electrical tree.

Keyword:

Community:

  • [ 1 ] [Zhu, Xiaoqian]Tsinghua Univ, State Key Lab Control & Simulat Power Syst & Gener, Beijing 100084, Peoples R China
  • [ 2 ] [Li, Yuhang]Tsinghua Univ, State Key Lab Control & Simulat Power Syst & Gener, Beijing 100084, Peoples R China
  • [ 3 ] [Zhou, Yuanxiang]Tsinghua Univ, State Key Lab Control & Simulat Power Syst & Gener, Beijing 100084, Peoples R China
  • [ 4 ] [Zhu, Xiaoqian]Tsinghua Univ, Dept Elect Engn, Beijing 100084, Peoples R China
  • [ 5 ] [Li, Yuhang]Tsinghua Univ, Dept Elect Engn, Beijing 100084, Peoples R China
  • [ 6 ] [Zhou, Yuanxiang]Tsinghua Univ, Dept Elect Engn, Beijing 100084, Peoples R China
  • [ 7 ] [Zhang, Yunxiao]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Fujian, Peoples R China
  • [ 8 ] [Liu, Xuanhao]NARI Technol Co Ltd, Nanjing 211106, Peoples R China
  • [ 9 ] [Chen, Ming]Xiamen Power Supply Co, State Grid Fujian Elect Power Co, Xiamen 361004, Peoples R China

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Source :

APPLIED PHYSICS LETTERS

ISSN: 0003-6951

Year: 2023

Issue: 10

Volume: 123

3 . 5

JCR@2023

3 . 5 0 0

JCR@2023

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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