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author:

Zhu, Xiaoqian (Zhu, Xiaoqian.) [1] | Li, Yuhang (Li, Yuhang.) [2] | Zhou, Yuanxiang (Zhou, Yuanxiang.) [3] | Zhang, Yunxiao (Zhang, Yunxiao.) [4] | Liu, Xuanhao (Liu, Xuanhao.) [5] | Chen, Ming (Chen, Ming.) [6]

Indexed by:

EI

Abstract:

Improving the electrical treeing resistance of polymer is of great significance for insulation reliability. To achieve this, a solution-based method is employed to introduce a voltage stabilizer with high electron affinity into the silicone rubber (SiR). Experimental findings demonstrate the voltage stabilizer's ability to improve the tree initiation voltage and provide evidence of their migration within the SiR. Additionally, by combining a finite element method, it has been confirmed that voltage stabilizers can migrate through dielectrophoresis in non-uniform electric fields and adaptively reposition themselves in response to changes in electric field distribution during the growth of the electrical tree. © 2023 Author(s).

Keyword:

Electric fields Electron affinity Electrophoresis Rubber Silicones

Community:

  • [ 1 ] [Zhu, Xiaoqian]State Key Lab of Control and Simulation of Power System and Generation Equipment, Department of Electrical Engineering, Tsinghua University, Beijing; 100084, China
  • [ 2 ] [Li, Yuhang]State Key Lab of Control and Simulation of Power System and Generation Equipment, Department of Electrical Engineering, Tsinghua University, Beijing; 100084, China
  • [ 3 ] [Zhou, Yuanxiang]State Key Lab of Control and Simulation of Power System and Generation Equipment, Department of Electrical Engineering, Tsinghua University, Beijing; 100084, China
  • [ 4 ] [Zhang, Yunxiao]College of Electrical Engineering and Automation, Fuzhou University, Fujian, Fuzhou; 350108, China
  • [ 5 ] [Liu, Xuanhao]NARI Technology Co., Ltd., Nanjing; 211106, China
  • [ 6 ] [Chen, Ming]Xiamen Power Supply Company, State Grid Fujian Electric Power Company, Xiamen; 361004, China

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Source :

Applied Physics Letters

ISSN: 0003-6951

Year: 2023

Issue: 10

Volume: 123

3 . 5

JCR@2023

3 . 5 0 0

JCR@2023

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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