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author:

Yang, Yan (Yang, Yan.) [1] (Scholars:杨艳) | Ge, Fang-Wen (Ge, Fang-Wen.) [2] | Liu, Xiang (Liu, Xiang.) [3]

Indexed by:

Scopus SCIE

Abstract:

For plate structures, their random parameters can be regarded as a two-dimensional random field in the plane. To solve the plate theory considering a two-dimensional random field, an efficient strategy for the stochastic finite element method was adopted. Firstly, the stochastic finite element method was used to establish the plate structural model, in which the random field characteristics of the parameter were considered, and the mathematical expression of its random field was obtained through the Karhunen-Loeve expansion; secondly, the point estimate method was applied to calculate the statistics of random structures. The computational efficiency can be significantly improved through the reference point selection strategy. The accuracy and efficiency of the calculation strategy were verified, and the influences of correlation length and coefficient of variation of the parameter on the random response of plate structures under different plate types (including Kirchhoff plate and Mindlin plate) and boundary conditions (including simply supported and clamped supported) were discussed. The proposed method can provide some help in solving static problems of plate structures.

Keyword:

Kirchhoff plate KL expansion Mindlin plate plate structure stochastic finite element method

Community:

  • [ 1 ] [Yang, Yan]Fuzhou Univ, Coll Civil Engn, Fuzhou 350118, Peoples R China
  • [ 2 ] [Yang, Yan]Fuzhou Univ, Zhicheng Coll, Dept Civil Engn, Fuzhou 350001, Peoples R China
  • [ 3 ] [Ge, Fang-Wen]Fujian Univ Technol, Coll Civil Engn, Fuzhou 350118, Peoples R China
  • [ 4 ] [Liu, Xiang]Fujian Univ Technol, Coll Civil Engn, Fuzhou 350118, Peoples R China

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Source :

MATHEMATICS

ISSN: 2227-7390

Year: 2023

Issue: 11

Volume: 11

2 . 3

JCR@2023

2 . 3 0 0

JCR@2023

ESI Discipline: MATHEMATICS;

ESI HC Threshold:13

JCR Journal Grade:1

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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