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author:

Zhang, Yunxiao (Zhang, Yunxiao.) [1] (Scholars:张云霄) | Zhou, Yuanxiang (Zhou, Yuanxiang.) [2] | Zhang, Ling (Zhang, Ling.) [3] | Teng, Chenyuan (Teng, Chenyuan.) [4] | Huang, Xin (Huang, Xin.) [5] | Chen, Jianning (Chen, Jianning.) [6] | Huang, Meng (Huang, Meng.) [7]

Indexed by:

EI SCIE

Abstract:

Electrical tree is one of the main reasons for cable failure. In this paper, the space charge evolution and electrical tree characteristics under polarity reversal voltage with varied temperature in silicone rubber (SIR) are carried out. Results show that as temperature rises from 30 degrees C to 120 degrees C, electrical tree initiation voltage declines by 17.8%. Meanwhile, the trees become denser, and the tree length is larger correspondingly. In order to ascertain the charge transportation and its influence on tree initiation process under polarity reversal voltage, we build a bipolar carrier transportation model with needle-plate electrode. Space charge transportation characteristics and corresponding electric field are simulated. Moreover, the evolution model of electrical tree under polarity reversal voltage is discussed. The presence of homo space charge leads electric field to become larger during the voltage reversal process. The segment relaxation of SIR and more, deeper space charge injection make tree initiate more easily at higher temperature.

Keyword:

Electrical tree degradation High temperature HVDC cables Polarity reversal voltage Space charge

Community:

  • [ 1 ] [Zhang, Yunxiao]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Fujian, Peoples R China
  • [ 2 ] [Zhang, Yunxiao]Tsinghua Univ, Dept Elect Engn, State Key Lab Elect Power Syst, Beijing 100084, Peoples R China
  • [ 3 ] [Zhou, Yuanxiang]Tsinghua Univ, Dept Elect Engn, State Key Lab Elect Power Syst, Beijing 100084, Peoples R China
  • [ 4 ] [Zhang, Ling]Tsinghua Univ, Dept Elect Engn, State Key Lab Elect Power Syst, Beijing 100084, Peoples R China
  • [ 5 ] [Teng, Chenyuan]Tsinghua Univ, Dept Elect Engn, State Key Lab Elect Power Syst, Beijing 100084, Peoples R China
  • [ 6 ] [Huang, Xin]Tsinghua Univ, Dept Elect Engn, State Key Lab Elect Power Syst, Beijing 100084, Peoples R China
  • [ 7 ] [Chen, Jianning]Tsinghua Univ, Dept Elect Engn, State Key Lab Elect Power Syst, Beijing 100084, Peoples R China
  • [ 8 ] [Huang, Meng]North China Elect Power Univ, State Key Lab Alternate Elect Power Syst Renewabl, Beijing 102206, Peoples R China

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Source :

JOURNAL OF ELECTROSTATICS

ISSN: 0304-3886

Year: 2022

Volume: 115

1 . 8

JCR@2022

1 . 9 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:66

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 7

SCOPUS Cited Count: 9

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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