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author:

Gu, Tianqi (Gu, Tianqi.) [1] (Scholars:顾天奇) | Lin, Hongxin (Lin, Hongxin.) [2] | Chen, Jianxiong (Chen, Jianxiong.) [3] (Scholars:陈剑雄) | Tang, Dawei (Tang, Dawei.) [4]

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CPCI-S EI

Abstract:

Surface reconstruction method plays an important role in many engineering fields. It is an imperative procedure to carry out surface reconstruction from measurement data in reverse engineering, which is complicated with the presence of outliers. To achieve better accuracy and robustness of reconstruction, an improved moving total least squares (MTLS) algorithm based on k-means clustering called KMTLS method is proposed in this article. KMTLS adjusts the weights of discrete points within the support domain by adopting a two-step fitting procedure. Firstly, ordinary least squares ( OLS) method is adopted to obtain the pre-fitting result and calculate the residuals as the input of k-means clustering. In k-means clustering, abnormal nodes are classified into one cluster and a weight function based on clustering information is introduced to deal with these nodes. Secondly, based on the compact weight function in MTLS and the weight obtained in the pre-fitting procedure, weighted total least squares method is conducted to determine the final estimated value. The process of detecting outliers is automatic without setting threshold artificially. The experiment shows that KMTLS has great robustness to outliers.

Keyword:

K-means clustering Moving total least squares Outliers Surface reconstruction

Community:

  • [ 1 ] [Gu, Tianqi]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 2 ] [Lin, Hongxin]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 3 ] [Chen, Jianxiong]Fuzhou Univ, Sch Mech Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 4 ] [Tang, Dawei]Univ Huddersfield, Ctr Precis Technol, Huddersfield HD1 3DH, W Yorkshire, England

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Source :

SEVENTH ASIA PACIFIC CONFERENCE ON OPTICS MANUFACTURE (APCOM 2021)

ISSN: 0277-786X

Year: 2022

Volume: 12166

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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