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author:

Miao, Yu (Miao, Yu.) [1] | Liang, Bing (Liang, Bing.) [2] | Tian, Yaoyao (Tian, Yaoyao.) [3] | Xiong, Tinghui (Xiong, Tinghui.) [4] | Sun, Shujing (Sun, Shujing.) [5] | Chen, Chenlong (Chen, Chenlong.) [6]

Indexed by:

EI

Abstract:

Changing the direction of horizontal nanowires to extend them in the z direction and grow obliquely has important practical significance for achieving higher density integration and making it have more free space in multi-dimension. However, how to guide the horizontal nanowires to extend in the z direction and grow obliquely is still a challenge. In this paper, we report the regular and horizontal β-Ga2O3 nanostructure grown on c-plane Al2O3 substrates, and the evolution of β-Ga2O3 nanowires from horizontal growth to obliquely upward growth through the chemical vapor deposition (CVD) method. Field-emission scanning electron microscopy, field-emission transmission electron microscopy, X-ray diffraction, Raman spectrum and photoluminescence spectroscopy were used to investigate the morphology, structure, components, and optical properties of the as-synthesized β-Ga2O3 nanowires. Due to the change of the growth interface at the Au catalysts, there are four different growth modes for the growth of β-Ga2O3 nanowires. The preparation route reported in this study is more simple, general and low-cost compared to other common growth methods for Ga2O3 nanomaterials, and these studies about the evolution of nanowires growth can provide a reference for the change of growth direction of nanowires and simplify planar device processing technology. © 2021 Elsevier Ltd

Keyword:

Alumina Aluminum oxide Chemical vapor deposition Epitaxial growth Field emission Field emission cathodes Field emission microscopes Gallium compounds High resolution transmission electron microscopy Nanowires Optical properties Photoluminescence spectroscopy Sapphire Scanning electron microscopy

Community:

  • [ 1 ] [Miao, Yu]College of Chemistry, Fuzhou University, Fuzhou; Fujian; 350116, China
  • [ 2 ] [Miao, Yu]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Science, Fuzhou; 350002, China
  • [ 3 ] [Liang, Bing]College of Chemistry, Fuzhou University, Fuzhou; Fujian; 350116, China
  • [ 4 ] [Liang, Bing]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Science, Fuzhou; 350002, China
  • [ 5 ] [Tian, Yaoyao]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Science, Fuzhou; 350002, China
  • [ 6 ] [Xiong, Tinghui]College of Chemistry, Fuzhou University, Fuzhou; Fujian; 350116, China
  • [ 7 ] [Xiong, Tinghui]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Science, Fuzhou; 350002, China
  • [ 8 ] [Sun, Shujing]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Science, Fuzhou; 350002, China
  • [ 9 ] [Chen, Chenlong]Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Science, Fuzhou; 350002, China

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Source :

Vacuum

ISSN: 0042-207X

Year: 2021

Volume: 192

4 . 1 1

JCR@2021

3 . 8 0 0

JCR@2023

ESI HC Threshold:142

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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