Indexed by:
Abstract:
本发明涉及一种磁性元件损耗测量方法,采用一功率变换器作为测试电路,在工况下测量所述测试电路的输入功率,然后选择所述测试电路中磁性元件的两端点并将被测磁性元件并联在所述两端点,之后测量并联被测磁性元件后所述测试电路的输入功率,并联被测磁性元件前后所述测试电路的输入功率之差即为所述被测磁性元件在工况下的损耗。该方法不仅提高了磁性元件损耗的测量精度,而且测量方便简单,成本低。
Keyword:
Reprint 's Address:
Email:
Patent Info :
Type: 发明授权
Patent No.: CN201310144862.7
Filing Date: 2013/4/23
Publication Date: 2015/6/3
Pub. No.: CN103226187B
公开国别: CN
Applicants: 福州大学
Legal Status: 授权
Cited Count:
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 0
Affiliated Colleges: